---
res:
  bibo_authorlist:
  - foaf_Person:
      foaf_givenName: Bernd
      foaf_name: Becker, Bernd
      foaf_surname: Becker
  - foaf_Person:
      foaf_givenName: Sybille
      foaf_name: Hellebrand, Sybille
      foaf_surname: Hellebrand
      foaf_workInfoHomepage: http://www.librecat.org/personId=209
    orcid: 0000-0002-3717-3939
  - foaf_Person:
      foaf_givenName: Ilia
      foaf_name: Polian, Ilia
      foaf_surname: Polian
  - foaf_Person:
      foaf_givenName: Bernd
      foaf_name: Straube, Bernd
      foaf_surname: Straube
  - foaf_Person:
      foaf_givenName: Wolfgang
      foaf_name: Vermeiren, Wolfgang
      foaf_surname: Vermeiren
  - foaf_Person:
      foaf_givenName: Hans-Joachim
      foaf_name: Wunderlich, Hans-Joachim
      foaf_surname: Wunderlich
  bibo_doi: 10.1109/dsnw.2010.5542612
  dct_date: 2010^xs_gYear
  dct_language: eng
  dct_publisher: IEEE@
  dct_title: Massive Statistical Process Variations - A Grand Challenge for Testing
    Nanoelectronic Circuits@
...