@inproceedings{12987,
  author       = {{Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}},
  booktitle    = {{40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W'10)}},
  publisher    = {{IEEE}},
  title        = {{{Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}}},
  doi          = {{10.1109/dsnw.2010.5542612}},
  year         = {{2010}},
}