{"date_created":"2019-08-28T09:22:54Z","citation":{"apa":"Froese, V., Ibers, R., &#38; Hellebrand, S. (2010). Reusing NoC-Infrastructure for Test Data Compression. <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, 227–231. <a href=\"https://doi.org/10.1109/vts.2010.5469570\">https://doi.org/10.1109/vts.2010.5469570</a>","ieee":"V. Froese, R. Ibers, and S. Hellebrand, “Reusing NoC-Infrastructure for Test Data Compression,” in <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, 2010, pp. 227–231, doi: <a href=\"https://doi.org/10.1109/vts.2010.5469570\">10.1109/vts.2010.5469570</a>.","ama":"Froese V, Ibers R, Hellebrand S. Reusing NoC-Infrastructure for Test Data Compression. In: <i>28th IEEE VLSI Test Symposium (VTS’10)</i>. IEEE; 2010:227-231. doi:<a href=\"https://doi.org/10.1109/vts.2010.5469570\">10.1109/vts.2010.5469570</a>","mla":"Froese, Viktor, et al. “Reusing NoC-Infrastructure for Test Data Compression.” <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, IEEE, 2010, pp. 227–31, doi:<a href=\"https://doi.org/10.1109/vts.2010.5469570\">10.1109/vts.2010.5469570</a>.","short":"V. Froese, R. Ibers, S. Hellebrand, in: 28th IEEE VLSI Test Symposium (VTS’10), IEEE, Santa Cruz, CA, USA, 2010, pp. 227–231.","chicago":"Froese, Viktor, Rüdiger Ibers, and Sybille Hellebrand. “Reusing NoC-Infrastructure for Test Data Compression.” In <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, 227–31. Santa Cruz, CA, USA: IEEE, 2010. <a href=\"https://doi.org/10.1109/vts.2010.5469570\">https://doi.org/10.1109/vts.2010.5469570</a>.","bibtex":"@inproceedings{Froese_Ibers_Hellebrand_2010, place={Santa Cruz, CA, USA}, title={Reusing NoC-Infrastructure for Test Data Compression}, DOI={<a href=\"https://doi.org/10.1109/vts.2010.5469570\">10.1109/vts.2010.5469570</a>}, booktitle={28th IEEE VLSI Test Symposium (VTS’10)}, publisher={IEEE}, author={Froese, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010}, pages={227–231} }"},"user_id":"209","department":[{"_id":"48"}],"title":"Reusing NoC-Infrastructure for Test Data Compression","_id":"12988","publisher":"IEEE","author":[{"first_name":"Viktor","full_name":"Froese, Viktor","last_name":"Froese"},{"id":"659","last_name":"Ibers","full_name":"Ibers, Rüdiger","first_name":"Rüdiger"},{"id":"209","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","first_name":"Sybille"}],"place":"Santa Cruz, CA, USA","year":"2010","status":"public","publication":"28th IEEE VLSI Test Symposium (VTS'10)","type":"conference","date_updated":"2022-05-11T16:22:36Z","page":"227-231","doi":"10.1109/vts.2010.5469570","language":[{"iso":"eng"}]}