{"year":"2009","page":"77","type":"conference","date_updated":"2022-05-11T16:27:03Z","doi":"10.1109/dft.2009.28","_id":"12990","user_id":"209","date_created":"2019-08-28T10:17:14Z","language":[{"iso":"eng"}],"author":[{"last_name":"Hellebrand","id":"209","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","first_name":"Sybille"},{"first_name":"Marc","full_name":"Hunger, Marc","last_name":"Hunger"}],"title":"Are Robust Circuits Really Robust?","citation":{"ieee":"S. Hellebrand and M. Hunger, “Are Robust Circuits Really Robust?,” in 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), 2009, p. 77, doi: 10.1109/dft.2009.28.","chicago":"Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?” In 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), 77. Chicago, IL, USA: IEEE, 2009. https://doi.org/10.1109/dft.2009.28.","ama":"Hellebrand S, Hunger M. Are Robust Circuits Really Robust? In: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk). IEEE; 2009:77. doi:10.1109/dft.2009.28","bibtex":"@inproceedings{Hellebrand_Hunger_2009, place={Chicago, IL, USA}, title={Are Robust Circuits Really Robust?}, DOI={10.1109/dft.2009.28}, booktitle={24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk)}, publisher={IEEE}, author={Hellebrand, Sybille and Hunger, Marc}, year={2009}, pages={77} }","short":"S. Hellebrand, M. Hunger, in: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), IEEE, Chicago, IL, USA, 2009, p. 77.","apa":"Hellebrand, S., & Hunger, M. (2009). Are Robust Circuits Really Robust? 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), 77. https://doi.org/10.1109/dft.2009.28","mla":"Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?” 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), IEEE, 2009, p. 77, doi:10.1109/dft.2009.28."},"status":"public","publisher":"IEEE","place":"Chicago, IL, USA","publication":"24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'09), (Invited Talk)","department":[{"_id":"48"}]}