{"author":[{"last_name":"Hunger","full_name":"Hunger, Marc","first_name":"Marc"},{"id":"209","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","first_name":"Sybille"},{"last_name":"Czutro","full_name":"Czutro, Alejandro","first_name":"Alejandro"},{"last_name":"Polian","full_name":"Polian, Ilia","first_name":"Ilia"},{"first_name":"Bernd","full_name":"Becker, Bernd","last_name":"Becker"}],"publisher":"IEEE","year":"2009","place":"Sesimbra-Lisbon, Portugal","status":"public","date_created":"2019-08-28T10:17:16Z","user_id":"209","citation":{"apa":"Hunger, M., Hellebrand, S., Czutro, A., Polian, I., &#38; Becker, B. (2009). ATPG-Based Grading of Strong Fault-Secureness. <i>15th IEEE International On-Line Testing Symposium (IOLTS’09</i>. <a href=\"https://doi.org/10.1109/iolts.2009.5196027\">https://doi.org/10.1109/iolts.2009.5196027</a>","short":"M. Hunger, S. Hellebrand, A. Czutro, I. Polian, B. Becker, in: 15th IEEE International On-Line Testing Symposium (IOLTS’09, IEEE, Sesimbra-Lisbon, Portugal, 2009.","chicago":"Hunger, Marc, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, and Bernd Becker. “ATPG-Based Grading of Strong Fault-Secureness.” In <i>15th IEEE International On-Line Testing Symposium (IOLTS’09</i>. Sesimbra-Lisbon, Portugal: IEEE, 2009. <a href=\"https://doi.org/10.1109/iolts.2009.5196027\">https://doi.org/10.1109/iolts.2009.5196027</a>.","ieee":"M. Hunger, S. Hellebrand, A. Czutro, I. Polian, and B. Becker, “ATPG-Based Grading of Strong Fault-Secureness,” 2009, doi: <a href=\"https://doi.org/10.1109/iolts.2009.5196027\">10.1109/iolts.2009.5196027</a>.","ama":"Hunger M, Hellebrand S, Czutro A, Polian I, Becker B. ATPG-Based Grading of Strong Fault-Secureness. In: <i>15th IEEE International On-Line Testing Symposium (IOLTS’09</i>. IEEE; 2009. doi:<a href=\"https://doi.org/10.1109/iolts.2009.5196027\">10.1109/iolts.2009.5196027</a>","mla":"Hunger, Marc, et al. “ATPG-Based Grading of Strong Fault-Secureness.” <i>15th IEEE International On-Line Testing Symposium (IOLTS’09</i>, IEEE, 2009, doi:<a href=\"https://doi.org/10.1109/iolts.2009.5196027\">10.1109/iolts.2009.5196027</a>.","bibtex":"@inproceedings{Hunger_Hellebrand_Czutro_Polian_Becker_2009, place={Sesimbra-Lisbon, Portugal}, title={ATPG-Based Grading of Strong Fault-Secureness}, DOI={<a href=\"https://doi.org/10.1109/iolts.2009.5196027\">10.1109/iolts.2009.5196027</a>}, booktitle={15th IEEE International On-Line Testing Symposium (IOLTS’09}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille and Czutro, Alejandro and Polian, Ilia and Becker, Bernd}, year={2009} }"},"title":"ATPG-Based Grading of Strong Fault-Secureness","_id":"12991","department":[{"_id":"48"}],"language":[{"iso":"eng"}],"type":"conference","date_updated":"2022-05-11T16:27:48Z","publication":"15th IEEE International On-Line Testing Symposium (IOLTS'09","doi":"10.1109/iolts.2009.5196027"}