{"title":"A Modular Memory BIST for Optimized Memory Repair","author":[{"full_name":"Oehler, Philipp","last_name":"Oehler","first_name":"Philipp"},{"full_name":"Bosio, Alberto","last_name":"Bosio","first_name":"Alberto"},{"first_name":"Giorgio","last_name":"di Natale","full_name":"di Natale, Giorgio"},{"first_name":"Sybille","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","id":"209","last_name":"Hellebrand"}],"status":"public","citation":{"ama":"Oehler P, Bosio A, di Natale G, Hellebrand S. A Modular Memory BIST for Optimized Memory Repair. In: 14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster). IEEE; 2008. doi:10.1109/iolts.2008.30","bibtex":"@inproceedings{Oehler_Bosio_di Natale_Hellebrand_2008, place={Rhodos, Greece}, title={A Modular Memory BIST for Optimized Memory Repair}, DOI={10.1109/iolts.2008.30}, booktitle={14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}, publisher={IEEE}, author={Oehler, Philipp and Bosio, Alberto and di Natale, Giorgio and Hellebrand, Sybille}, year={2008} }","ieee":"P. Oehler, A. Bosio, G. di Natale, and S. Hellebrand, “A Modular Memory BIST for Optimized Memory Repair,” 2008, doi: 10.1109/iolts.2008.30.","chicago":"Oehler, Philipp, Alberto Bosio, Giorgio di Natale, and Sybille Hellebrand. “A Modular Memory BIST for Optimized Memory Repair.” In 14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster). Rhodos, Greece: IEEE, 2008. https://doi.org/10.1109/iolts.2008.30.","short":"P. Oehler, A. Bosio, G. di Natale, S. Hellebrand, in: 14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster), IEEE, Rhodos, Greece, 2008.","apa":"Oehler, P., Bosio, A., di Natale, G., & Hellebrand, S. (2008). A Modular Memory BIST for Optimized Memory Repair. 14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster). https://doi.org/10.1109/iolts.2008.30","mla":"Oehler, Philipp, et al. “A Modular Memory BIST for Optimized Memory Repair.” 14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster), IEEE, 2008, doi:10.1109/iolts.2008.30."},"publisher":"IEEE","department":[{"_id":"48"}],"publication":"14th IEEE International On-Line Testing Symposium (IOLTS'08), (Poster)","place":"Rhodos, Greece","type":"conference","year":"2008","date_updated":"2022-05-11T16:29:13Z","doi":"10.1109/iolts.2008.30","date_created":"2019-08-28T10:18:10Z","language":[{"iso":"eng"}],"_id":"12992","user_id":"209"}