{"publisher":"IEEE","date_updated":"2022-05-11T16:29:13Z","citation":{"ama":"Oehler P, Bosio A, di Natale G, Hellebrand S. A Modular Memory BIST for Optimized Memory Repair. In: <i>14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)</i>. IEEE; 2008. doi:<a href=\"https://doi.org/10.1109/iolts.2008.30\">10.1109/iolts.2008.30</a>","apa":"Oehler, P., Bosio, A., di Natale, G., &#38; Hellebrand, S. (2008). A Modular Memory BIST for Optimized Memory Repair. <i>14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)</i>. <a href=\"https://doi.org/10.1109/iolts.2008.30\">https://doi.org/10.1109/iolts.2008.30</a>","mla":"Oehler, Philipp, et al. “A Modular Memory BIST for Optimized Memory Repair.” <i>14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)</i>, IEEE, 2008, doi:<a href=\"https://doi.org/10.1109/iolts.2008.30\">10.1109/iolts.2008.30</a>.","chicago":"Oehler, Philipp, Alberto Bosio, Giorgio di Natale, and Sybille Hellebrand. “A Modular Memory BIST for Optimized Memory Repair.” In <i>14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)</i>. Rhodos, Greece: IEEE, 2008. <a href=\"https://doi.org/10.1109/iolts.2008.30\">https://doi.org/10.1109/iolts.2008.30</a>.","ieee":"P. Oehler, A. Bosio, G. di Natale, and S. Hellebrand, “A Modular Memory BIST for Optimized Memory Repair,” 2008, doi: <a href=\"https://doi.org/10.1109/iolts.2008.30\">10.1109/iolts.2008.30</a>.","bibtex":"@inproceedings{Oehler_Bosio_di Natale_Hellebrand_2008, place={Rhodos, Greece}, title={A Modular Memory BIST for Optimized Memory Repair}, DOI={<a href=\"https://doi.org/10.1109/iolts.2008.30\">10.1109/iolts.2008.30</a>}, booktitle={14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}, publisher={IEEE}, author={Oehler, Philipp and Bosio, Alberto and di Natale, Giorgio and Hellebrand, Sybille}, year={2008} }","short":"P. Oehler, A. Bosio, G. di Natale, S. Hellebrand, in: 14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster), IEEE, Rhodos, Greece, 2008."},"year":"2008","language":[{"iso":"eng"}],"status":"public","_id":"12992","doi":"10.1109/iolts.2008.30","place":"Rhodos, Greece","publication":"14th IEEE International On-Line Testing Symposium (IOLTS'08), (Poster)","date_created":"2019-08-28T10:18:10Z","author":[{"first_name":"Philipp","last_name":"Oehler","full_name":"Oehler, Philipp"},{"full_name":"Bosio, Alberto","last_name":"Bosio","first_name":"Alberto"},{"full_name":"di Natale, Giorgio","last_name":"di Natale","first_name":"Giorgio"},{"full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","first_name":"Sybille","id":"209"}],"department":[{"_id":"48"}],"title":"A Modular Memory BIST for Optimized Memory Repair","type":"conference","user_id":"209"}