{"type":"conference","_id":"12993","year":"2008","author":[{"first_name":"Marc","full_name":"Hunger, Marc","last_name":"Hunger"},{"last_name":"Hellebrand","orcid":"0000-0002-3717-3939","first_name":"Sybille","full_name":"Hellebrand, Sybille","id":"209"}],"department":[{"_id":"48"}],"date_updated":"2022-05-11T16:29:56Z","date_created":"2019-08-28T10:18:11Z","doi":"10.1109/iolts.2008.32","status":"public","title":"Verification and Analysis of Self-Checking Properties through ATPG","user_id":"209","citation":{"mla":"Hunger, Marc, and Sybille Hellebrand. “Verification and Analysis of Self-Checking Properties through ATPG.” 14th IEEE International On-Line Testing Symposium (IOLTS’08), IEEE, 2008, doi:10.1109/iolts.2008.32.","bibtex":"@inproceedings{Hunger_Hellebrand_2008, place={Rhodos, Greece}, title={Verification and Analysis of Self-Checking Properties through ATPG}, DOI={10.1109/iolts.2008.32}, booktitle={14th IEEE International On-Line Testing Symposium (IOLTS’08)}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille}, year={2008} }","chicago":"Hunger, Marc, and Sybille Hellebrand. “Verification and Analysis of Self-Checking Properties through ATPG.” In 14th IEEE International On-Line Testing Symposium (IOLTS’08). Rhodos, Greece: IEEE, 2008. https://doi.org/10.1109/iolts.2008.32.","apa":"Hunger, M., & Hellebrand, S. (2008). Verification and Analysis of Self-Checking Properties through ATPG. 14th IEEE International On-Line Testing Symposium (IOLTS’08). https://doi.org/10.1109/iolts.2008.32","short":"M. Hunger, S. Hellebrand, in: 14th IEEE International On-Line Testing Symposium (IOLTS’08), IEEE, Rhodos, Greece, 2008.","ieee":"M. Hunger and S. Hellebrand, “Verification and Analysis of Self-Checking Properties through ATPG,” 2008, doi: 10.1109/iolts.2008.32.","ama":"Hunger M, Hellebrand S. Verification and Analysis of Self-Checking Properties through ATPG. In: 14th IEEE International On-Line Testing Symposium (IOLTS’08). IEEE; 2008. doi:10.1109/iolts.2008.32"},"place":"Rhodos, Greece","language":[{"iso":"eng"}],"publisher":"IEEE","publication":"14th IEEE International On-Line Testing Symposium (IOLTS'08)"}