{"status":"public","language":[{"iso":"eng"}],"year":"2008","citation":{"short":"U. Amgalan, C. Hachmann, S. Hellebrand, H.-J. Wunderlich, in: 26th IEEE VLSI Test Symposium (VTS’08), IEEE, San Diego, CA, USA, 2008, pp. 125–130.","mla":"Amgalan, Uranmandakh, et al. “Signature Rollback - A Technique for Testing Robust Circuits.” <i>26th IEEE VLSI Test Symposium (VTS’08)</i>, IEEE, 2008, pp. 125–30, doi:<a href=\"https://doi.org/10.1109/vts.2008.34\">10.1109/vts.2008.34</a>.","chicago":"Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Signature Rollback - A Technique for Testing Robust Circuits.” In <i>26th IEEE VLSI Test Symposium (VTS’08)</i>, 125–30. San Diego, CA, USA: IEEE, 2008. <a href=\"https://doi.org/10.1109/vts.2008.34\">https://doi.org/10.1109/vts.2008.34</a>.","ieee":"U. Amgalan, C. Hachmann, S. Hellebrand, and H.-J. Wunderlich, “Signature Rollback - A Technique for Testing Robust Circuits,” in <i>26th IEEE VLSI Test Symposium (VTS’08)</i>, 2008, pp. 125–130, doi: <a href=\"https://doi.org/10.1109/vts.2008.34\">10.1109/vts.2008.34</a>.","bibtex":"@inproceedings{Amgalan_Hachmann_Hellebrand_Wunderlich_2008, place={San Diego, CA, USA}, title={Signature Rollback - A Technique for Testing Robust Circuits}, DOI={<a href=\"https://doi.org/10.1109/vts.2008.34\">10.1109/vts.2008.34</a>}, booktitle={26th IEEE VLSI Test Symposium (VTS’08)}, publisher={IEEE}, author={Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2008}, pages={125–130} }","ama":"Amgalan U, Hachmann C, Hellebrand S, Wunderlich H-J. Signature Rollback - A Technique for Testing Robust Circuits. In: <i>26th IEEE VLSI Test Symposium (VTS’08)</i>. IEEE; 2008:125-130. doi:<a href=\"https://doi.org/10.1109/vts.2008.34\">10.1109/vts.2008.34</a>","apa":"Amgalan, U., Hachmann, C., Hellebrand, S., &#38; Wunderlich, H.-J. (2008). Signature Rollback - A Technique for Testing Robust Circuits. <i>26th IEEE VLSI Test Symposium (VTS’08)</i>, 125–130. <a href=\"https://doi.org/10.1109/vts.2008.34\">https://doi.org/10.1109/vts.2008.34</a>"},"publisher":"IEEE","date_updated":"2022-05-11T16:30:36Z","page":"125-130","user_id":"209","publication":"26th IEEE VLSI Test Symposium (VTS'08)","place":"San Diego, CA, USA","date_created":"2019-08-28T10:18:56Z","department":[{"_id":"48"}],"title":"Signature Rollback - A Technique for Testing Robust Circuits","author":[{"last_name":"Amgalan","full_name":"Amgalan, Uranmandakh","first_name":"Uranmandakh"},{"first_name":"Christian","full_name":"Hachmann, Christian","last_name":"Hachmann"},{"id":"209","first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"type":"conference","_id":"12994","doi":"10.1109/vts.2008.34"}