Signature Rollback - A Technique for Testing Robust Circuits

conference paper Signature Rollback - A Technique for Testing Robust Circuits Uranmandakh Amgalan author Christian Hachmann author Sybille Hellebrand author 2090000-0002-3717-3939 Hans-Joachim Wunderlich author 48 department IEEE2008 eng 26th IEEE VLSI Test Symposium (VTS'08)10.1109/vts.2008.34 125-130 Amgalan, U., Hachmann, C., Hellebrand, S., & Wunderlich, H.-J. (2008). Signature Rollback - A Technique for Testing Robust Circuits. 26th IEEE VLSI Test Symposium (VTS’08), 125–130. <a href="https://doi.org/10.1109/vts.2008.34">https://doi.org/10.1109/vts.2008.34</a> U. Amgalan, C. Hachmann, S. Hellebrand, and H.-J. Wunderlich, “Signature Rollback - A Technique for Testing Robust Circuits,” in 26th IEEE VLSI Test Symposium (VTS’08), 2008, pp. 125–130, doi: <a href="https://doi.org/10.1109/vts.2008.34">10.1109/vts.2008.34</a>. U. Amgalan, C. Hachmann, S. Hellebrand, H.-J. Wunderlich, in: 26th IEEE VLSI Test Symposium (VTS’08), IEEE, San Diego, CA, USA, 2008, pp. 125–130. Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Signature Rollback - A Technique for Testing Robust Circuits.” In 26th IEEE VLSI Test Symposium (VTS’08), 125–30. San Diego, CA, USA: IEEE, 2008. <a href="https://doi.org/10.1109/vts.2008.34">https://doi.org/10.1109/vts.2008.34</a>. Amgalan, Uranmandakh, et al. “Signature Rollback - A Technique for Testing Robust Circuits.” 26th IEEE VLSI Test Symposium (VTS’08), IEEE, 2008, pp. 125–30, doi:<a href="https://doi.org/10.1109/vts.2008.34">10.1109/vts.2008.34</a>. Amgalan U, Hachmann C, Hellebrand S, Wunderlich H-J. Signature Rollback - A Technique for Testing Robust Circuits. In: 26th IEEE VLSI Test Symposium (VTS’08). IEEE; 2008:125-130. doi:<a href="https://doi.org/10.1109/vts.2008.34">10.1109/vts.2008.34</a> @inproceedings{Amgalan_Hachmann_Hellebrand_Wunderlich_2008, place={San Diego, CA, USA}, title={Signature Rollback - A Technique for Testing Robust Circuits}, DOI={<a href="https://doi.org/10.1109/vts.2008.34">10.1109/vts.2008.34</a>}, booktitle={26th IEEE VLSI Test Symposium (VTS’08)}, publisher={IEEE}, author={Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2008}, pages={125–130} } 129942019-08-28T10:18:56Z2022-05-11T16:30:36Z