{"user_id":"209","citation":{"ieee":"S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, and B. Straube, “A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction,” in <i>22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)</i>, 2007, pp. 50–58, doi: <a href=\"https://doi.org/10.1109/dft.2007.43\">10.1109/dft.2007.43</a>.","ama":"Hellebrand S, G. Zoellin C, Wunderlich H-J, Ludwig S, Coym T, Straube B. A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction. In: <i>22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)</i>. IEEE; 2007:50-58. doi:<a href=\"https://doi.org/10.1109/dft.2007.43\">10.1109/dft.2007.43</a>","mla":"Hellebrand, Sybille, et al. “A Refined Electrical Model for Particle Strikes and Its Impact on SEU Prediction.” <i>22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)</i>, IEEE, 2007, pp. 50–58, doi:<a href=\"https://doi.org/10.1109/dft.2007.43\">10.1109/dft.2007.43</a>.","bibtex":"@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Rome, Italy}, title={A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction}, DOI={<a href=\"https://doi.org/10.1109/dft.2007.43\">10.1109/dft.2007.43</a>}, booktitle={22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}, publisher={IEEE}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={50–58} }","chicago":"Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “A Refined Electrical Model for Particle Strikes and Its Impact on SEU Prediction.” In <i>22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)</i>, 50–58. Rome, Italy: IEEE, 2007. <a href=\"https://doi.org/10.1109/dft.2007.43\">https://doi.org/10.1109/dft.2007.43</a>.","apa":"Hellebrand, S., G. Zoellin, C., Wunderlich, H.-J., Ludwig, S., Coym, T., &#38; Straube, B. (2007). A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction. <i>22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)</i>, 50–58. <a href=\"https://doi.org/10.1109/dft.2007.43\">https://doi.org/10.1109/dft.2007.43</a>","short":"S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, B. Straube, in: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), IEEE, Rome, Italy, 2007, pp. 50–58."},"date_created":"2019-08-28T10:18:57Z","_id":"12995","title":"A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction","department":[{"_id":"48"}],"author":[{"first_name":"Sybille","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209","last_name":"Hellebrand"},{"first_name":"Christian","full_name":"G. Zoellin, Christian","last_name":"G. Zoellin"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"},{"full_name":"Ludwig, Stefan","last_name":"Ludwig","first_name":"Stefan"},{"first_name":"Torsten","last_name":"Coym","full_name":"Coym, Torsten"},{"last_name":"Straube","full_name":"Straube, Bernd","first_name":"Bernd"}],"publisher":"IEEE","status":"public","year":"2007","place":"Rome, Italy","page":"50-58","type":"conference","date_updated":"2022-05-11T16:32:38Z","publication":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'07)","doi":"10.1109/dft.2007.43","language":[{"iso":"eng"}]}