{"doi":"10.1109/ets.2007.10","department":[{"_id":"48"}],"citation":{"mla":"Oehler, Philipp, et al. “An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy.” <i>12th IEEE European Test Symposium (ETS’07)</i>, IEEE, 2007, pp. 91–96, doi:<a href=\"https://doi.org/10.1109/ets.2007.10\">10.1109/ets.2007.10</a>.","ieee":"P. Oehler, S. Hellebrand, and H.-J. Wunderlich, “An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy,” in <i>12th IEEE European Test Symposium (ETS’07)</i>, 2007, pp. 91–96, doi: <a href=\"https://doi.org/10.1109/ets.2007.10\">10.1109/ets.2007.10</a>.","apa":"Oehler, P., Hellebrand, S., &#38; Wunderlich, H.-J. (2007). An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. <i>12th IEEE European Test Symposium (ETS’07)</i>, 91–96. <a href=\"https://doi.org/10.1109/ets.2007.10\">https://doi.org/10.1109/ets.2007.10</a>","short":"P. Oehler, S. Hellebrand, H.-J. Wunderlich, in: 12th IEEE European Test Symposium (ETS’07), IEEE, Freiburg, Germany, 2007, pp. 91–96.","ama":"Oehler P, Hellebrand S, Wunderlich H-J. An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. In: <i>12th IEEE European Test Symposium (ETS’07)</i>. IEEE; 2007:91-96. doi:<a href=\"https://doi.org/10.1109/ets.2007.10\">10.1109/ets.2007.10</a>","chicago":"Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. “An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy.” In <i>12th IEEE European Test Symposium (ETS’07)</i>, 91–96. Freiburg, Germany: IEEE, 2007. <a href=\"https://doi.org/10.1109/ets.2007.10\">https://doi.org/10.1109/ets.2007.10</a>.","bibtex":"@inproceedings{Oehler_Hellebrand_Wunderlich_2007, place={Freiburg, Germany}, title={An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy}, DOI={<a href=\"https://doi.org/10.1109/ets.2007.10\">10.1109/ets.2007.10</a>}, booktitle={12th IEEE European Test Symposium (ETS’07)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007}, pages={91–96} }"},"place":"Freiburg, Germany","publisher":"IEEE","user_id":"209","type":"conference","page":"91-96","publication":"12th IEEE European Test Symposium (ETS'07)","date_created":"2019-08-28T10:19:53Z","title":"An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy","date_updated":"2022-05-11T16:33:32Z","author":[{"first_name":"Philipp","last_name":"Oehler","full_name":"Oehler, Philipp"},{"id":"209","first_name":"Sybille","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","last_name":"Hellebrand"},{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"}],"status":"public","language":[{"iso":"eng"}],"_id":"12997","year":"2007"}