{"language":[{"iso":"eng"}],"page":"148-153","publication":"10th IEEE European Test Symposium (ETS'05)","type":"conference","date_updated":"2022-05-11T16:40:36Z","doi":"10.1109/ets.2005.28","author":[{"first_name":"Philipp","full_name":"Oehler, Philipp","last_name":"Oehler"},{"orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand","id":"209","full_name":"Hellebrand, Sybille"}],"publisher":"IEEE","status":"public","place":"Tallinn, Estonia","year":"2005","citation":{"short":"P. Oehler, S. Hellebrand, in: 10th IEEE European Test Symposium (ETS’05), IEEE, Tallinn, Estonia, 2005, pp. 148–153.","chicago":"Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.” In <i>10th IEEE European Test Symposium (ETS’05)</i>, 148–53. Tallinn, Estonia: IEEE, 2005. <a href=\"https://doi.org/10.1109/ets.2005.28\">https://doi.org/10.1109/ets.2005.28</a>.","bibtex":"@inproceedings{Oehler_Hellebrand_2005, place={Tallinn, Estonia}, title={Low Power Embedded DRAMs with High Quality Error Correcting Capabilities}, DOI={<a href=\"https://doi.org/10.1109/ets.2005.28\">10.1109/ets.2005.28</a>}, booktitle={10th IEEE European Test Symposium (ETS’05)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005}, pages={148–153} }","apa":"Oehler, P., &#38; Hellebrand, S. (2005). Low Power Embedded DRAMs with High Quality Error Correcting Capabilities. <i>10th IEEE European Test Symposium (ETS’05)</i>, 148–153. <a href=\"https://doi.org/10.1109/ets.2005.28\">https://doi.org/10.1109/ets.2005.28</a>","mla":"Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.” <i>10th IEEE European Test Symposium (ETS’05)</i>, IEEE, 2005, pp. 148–53, doi:<a href=\"https://doi.org/10.1109/ets.2005.28\">10.1109/ets.2005.28</a>.","ama":"Oehler P, Hellebrand S. Low Power Embedded DRAMs with High Quality Error Correcting Capabilities. In: <i>10th IEEE European Test Symposium (ETS’05)</i>. IEEE; 2005:148-153. doi:<a href=\"https://doi.org/10.1109/ets.2005.28\">10.1109/ets.2005.28</a>","ieee":"P. Oehler and S. Hellebrand, “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities,” in <i>10th IEEE European Test Symposium (ETS’05)</i>, 2005, pp. 148–153, doi: <a href=\"https://doi.org/10.1109/ets.2005.28\">10.1109/ets.2005.28</a>."},"user_id":"209","date_created":"2019-08-28T10:20:56Z","department":[{"_id":"48"}],"_id":"13000","title":"Low Power Embedded DRAMs with High Quality Error Correcting Capabilities"}