{"doi":"10.1109/test.2004.1387357","place":"Charlotte, NC, USA","language":[{"iso":"eng"}],"date_updated":"2022-05-11T16:41:16Z","type":"conference","user_id":"209","publication":"IEEE International Test Conference (ITC'04)","publisher":"IEEE","_id":"13001","status":"public","citation":{"ama":"Wuertenberger A, S. Tautermann C, Hellebrand S. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. In: <i>IEEE International Test Conference (ITC’04)</i>. IEEE; 2004:926-935. doi:<a href=\"https://doi.org/10.1109/test.2004.1387357\">10.1109/test.2004.1387357</a>","apa":"Wuertenberger, A., S. Tautermann, C., &#38; Hellebrand, S. (2004). Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. <i>IEEE International Test Conference (ITC’04)</i>, 926–935. <a href=\"https://doi.org/10.1109/test.2004.1387357\">https://doi.org/10.1109/test.2004.1387357</a>","mla":"Wuertenberger, Armin, et al. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” <i>IEEE International Test Conference (ITC’04)</i>, IEEE, 2004, pp. 926–35, doi:<a href=\"https://doi.org/10.1109/test.2004.1387357\">10.1109/test.2004.1387357</a>.","chicago":"Wuertenberger, Armin, Christofer S. Tautermann, and Sybille Hellebrand. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” In <i>IEEE International Test Conference (ITC’04)</i>, 926–35. Charlotte, NC, USA: IEEE, 2004. <a href=\"https://doi.org/10.1109/test.2004.1387357\">https://doi.org/10.1109/test.2004.1387357</a>.","bibtex":"@inproceedings{Wuertenberger_S. Tautermann_Hellebrand_2004, place={Charlotte, NC, USA}, title={Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}, DOI={<a href=\"https://doi.org/10.1109/test.2004.1387357\">10.1109/test.2004.1387357</a>}, booktitle={IEEE International Test Conference (ITC’04)}, publisher={IEEE}, author={Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}, year={2004}, pages={926–935} }","ieee":"A. Wuertenberger, C. S. Tautermann, and S. Hellebrand, “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections,” in <i>IEEE International Test Conference (ITC’04)</i>, 2004, pp. 926–935, doi: <a href=\"https://doi.org/10.1109/test.2004.1387357\">10.1109/test.2004.1387357</a>.","short":"A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: IEEE International Test Conference (ITC’04), IEEE, Charlotte, NC, USA, 2004, pp. 926–935."},"author":[{"full_name":"Wuertenberger, Armin","first_name":"Armin","last_name":"Wuertenberger"},{"first_name":"Christofer","last_name":"S. Tautermann","full_name":"S. Tautermann, Christofer"},{"orcid":"0000-0002-3717-3939","last_name":"Hellebrand","first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille"}],"title":"Data Compression for Multiple Scan Chains Using Dictionaries with Corrections","department":[{"_id":"48"}],"year":"2004","date_created":"2019-08-28T10:20:57Z","page":"926-935","extern":"1"}