[{"place":"Charlotte, NC, USA","department":[{"_id":"48"}],"title":"A Hybrid Coding Strategy for Optimized Test Data Compression","user_id":"659","page":"451-459","type":"conference","year":"2003","publisher":"{IEEE}","_id":"13002","date_created":"2019-08-28T10:23:18Z","extern":"1","status":"public","language":[{"iso":"eng"}],"citation":{"mla":"Wuertenberger, Armin, et al. “A Hybrid Coding Strategy for Optimized Test Data Compression.” <i>{IEEE International Test Conference (ITC’03)}</i>, {IEEE}, 2003, pp. 451–59, doi:<a href=\"https://doi.org/10.1109/test.2003.1270870\">10.1109/test.2003.1270870</a>.","ieee":"A. Wuertenberger, C. S. Tautermann, and S. Hellebrand, “A Hybrid Coding Strategy for Optimized Test Data Compression,” in <i>{IEEE International Test Conference (ITC’03)}</i>, 2003, pp. 451–459.","chicago":"Wuertenberger, Armin, Christofer S. Tautermann, and Sybille Hellebrand. “A Hybrid Coding Strategy for Optimized Test Data Compression.” In <i>{IEEE International Test Conference (ITC’03)}</i>, 451–59. Charlotte, NC, USA: {IEEE}, 2003. <a href=\"https://doi.org/10.1109/test.2003.1270870\">https://doi.org/10.1109/test.2003.1270870</a>.","apa":"Wuertenberger, A., S. Tautermann, C., &#38; Hellebrand, S. (2003). A Hybrid Coding Strategy for Optimized Test Data Compression. In <i>{IEEE International Test Conference (ITC’03)}</i> (pp. 451–459). Charlotte, NC, USA: {IEEE}. <a href=\"https://doi.org/10.1109/test.2003.1270870\">https://doi.org/10.1109/test.2003.1270870</a>","short":"A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: {IEEE International Test Conference (ITC’03)}, {IEEE}, Charlotte, NC, USA, 2003, pp. 451–459.","ama":"Wuertenberger A, S. Tautermann C, Hellebrand S. A Hybrid Coding Strategy for Optimized Test Data Compression. In: <i>{IEEE International Test Conference (ITC’03)}</i>. Charlotte, NC, USA: {IEEE}; 2003:451-459. doi:<a href=\"https://doi.org/10.1109/test.2003.1270870\">10.1109/test.2003.1270870</a>","bibtex":"@inproceedings{Wuertenberger_S. Tautermann_Hellebrand_2003, place={Charlotte, NC, USA}, title={A Hybrid Coding Strategy for Optimized Test Data Compression}, DOI={<a href=\"https://doi.org/10.1109/test.2003.1270870\">10.1109/test.2003.1270870</a>}, booktitle={{IEEE International Test Conference (ITC’03)}}, publisher={{IEEE}}, author={Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}, year={2003}, pages={451–459} }"},"author":[{"full_name":"Wuertenberger, Armin","first_name":"Armin","last_name":"Wuertenberger"},{"first_name":"Christofer","last_name":"S. Tautermann","full_name":"S. Tautermann, Christofer"},{"first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209"}],"date_updated":"2020-05-07T05:16:00Z","doi":"10.1109/test.2003.1270870","publication":"{IEEE International Test Conference (ITC'03)}"}]