{"year":"2003","type":"conference","page":"451-459","date_updated":"2022-05-11T16:41:56Z","doi":"10.1109/test.2003.1270870","user_id":"209","_id":"13002","date_created":"2019-08-28T10:23:18Z","language":[{"iso":"eng"}],"author":[{"last_name":"Wuertenberger","full_name":"Wuertenberger, Armin","first_name":"Armin"},{"first_name":"Christofer","last_name":"S. Tautermann","full_name":"S. Tautermann, Christofer"},{"first_name":"Sybille","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209","last_name":"Hellebrand"}],"title":"A Hybrid Coding Strategy for Optimized Test Data Compression","citation":{"ama":"Wuertenberger A, S. Tautermann C, Hellebrand S. A Hybrid Coding Strategy for Optimized Test Data Compression. In: <i>IEEE International Test Conference (ITC’03)</i>. IEEE; 2003:451-459. doi:<a href=\"https://doi.org/10.1109/test.2003.1270870\">10.1109/test.2003.1270870</a>","bibtex":"@inproceedings{Wuertenberger_S. Tautermann_Hellebrand_2003, place={Charlotte, NC, USA}, title={A Hybrid Coding Strategy for Optimized Test Data Compression}, DOI={<a href=\"https://doi.org/10.1109/test.2003.1270870\">10.1109/test.2003.1270870</a>}, booktitle={IEEE International Test Conference (ITC’03)}, publisher={IEEE}, author={Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}, year={2003}, pages={451–459} }","chicago":"Wuertenberger, Armin, Christofer S. Tautermann, and Sybille Hellebrand. “A Hybrid Coding Strategy for Optimized Test Data Compression.” In <i>IEEE International Test Conference (ITC’03)</i>, 451–59. Charlotte, NC, USA: IEEE, 2003. <a href=\"https://doi.org/10.1109/test.2003.1270870\">https://doi.org/10.1109/test.2003.1270870</a>.","ieee":"A. Wuertenberger, C. S. Tautermann, and S. Hellebrand, “A Hybrid Coding Strategy for Optimized Test Data Compression,” in <i>IEEE International Test Conference (ITC’03)</i>, 2003, pp. 451–459, doi: <a href=\"https://doi.org/10.1109/test.2003.1270870\">10.1109/test.2003.1270870</a>.","apa":"Wuertenberger, A., S. Tautermann, C., &#38; Hellebrand, S. (2003). A Hybrid Coding Strategy for Optimized Test Data Compression. <i>IEEE International Test Conference (ITC’03)</i>, 451–459. <a href=\"https://doi.org/10.1109/test.2003.1270870\">https://doi.org/10.1109/test.2003.1270870</a>","short":"A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: IEEE International Test Conference (ITC’03), IEEE, Charlotte, NC, USA, 2003, pp. 451–459.","mla":"Wuertenberger, Armin, et al. “A Hybrid Coding Strategy for Optimized Test Data Compression.” <i>IEEE International Test Conference (ITC’03)</i>, IEEE, 2003, pp. 451–59, doi:<a href=\"https://doi.org/10.1109/test.2003.1270870\">10.1109/test.2003.1270870</a>."},"status":"public","publisher":"IEEE","extern":"1","publication":"IEEE International Test Conference (ITC'03)","place":"Charlotte, NC, USA","department":[{"_id":"48"}]}