{"_id":"13002","year":"2003","place":"Charlotte, NC, USA","citation":{"apa":"Wuertenberger, A., S. Tautermann, C., &#38; Hellebrand, S. (2003). A Hybrid Coding Strategy for Optimized Test Data Compression. <i>IEEE International Test Conference (ITC’03)</i>, 451–459. <a href=\"https://doi.org/10.1109/test.2003.1270870\">https://doi.org/10.1109/test.2003.1270870</a>","ama":"Wuertenberger A, S. Tautermann C, Hellebrand S. A Hybrid Coding Strategy for Optimized Test Data Compression. In: <i>IEEE International Test Conference (ITC’03)</i>. IEEE; 2003:451-459. doi:<a href=\"https://doi.org/10.1109/test.2003.1270870\">10.1109/test.2003.1270870</a>","mla":"Wuertenberger, Armin, et al. “A Hybrid Coding Strategy for Optimized Test Data Compression.” <i>IEEE International Test Conference (ITC’03)</i>, IEEE, 2003, pp. 451–59, doi:<a href=\"https://doi.org/10.1109/test.2003.1270870\">10.1109/test.2003.1270870</a>.","chicago":"Wuertenberger, Armin, Christofer S. Tautermann, and Sybille Hellebrand. “A Hybrid Coding Strategy for Optimized Test Data Compression.” In <i>IEEE International Test Conference (ITC’03)</i>, 451–59. Charlotte, NC, USA: IEEE, 2003. <a href=\"https://doi.org/10.1109/test.2003.1270870\">https://doi.org/10.1109/test.2003.1270870</a>.","short":"A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: IEEE International Test Conference (ITC’03), IEEE, Charlotte, NC, USA, 2003, pp. 451–459.","bibtex":"@inproceedings{Wuertenberger_S. Tautermann_Hellebrand_2003, place={Charlotte, NC, USA}, title={A Hybrid Coding Strategy for Optimized Test Data Compression}, DOI={<a href=\"https://doi.org/10.1109/test.2003.1270870\">10.1109/test.2003.1270870</a>}, booktitle={IEEE International Test Conference (ITC’03)}, publisher={IEEE}, author={Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}, year={2003}, pages={451–459} }","ieee":"A. Wuertenberger, C. S. Tautermann, and S. Hellebrand, “A Hybrid Coding Strategy for Optimized Test Data Compression,” in <i>IEEE International Test Conference (ITC’03)</i>, 2003, pp. 451–459, doi: <a href=\"https://doi.org/10.1109/test.2003.1270870\">10.1109/test.2003.1270870</a>."},"language":[{"iso":"eng"}],"date_created":"2019-08-28T10:23:18Z","publisher":"IEEE","publication":"IEEE International Test Conference (ITC'03)","page":"451-459","author":[{"last_name":"Wuertenberger","first_name":"Armin","full_name":"Wuertenberger, Armin"},{"last_name":"S. Tautermann","first_name":"Christofer","full_name":"S. Tautermann, Christofer"},{"last_name":"Hellebrand","first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939"}],"status":"public","title":"A Hybrid Coding Strategy for Optimized Test Data Compression","date_updated":"2022-05-11T16:41:56Z","user_id":"209","type":"conference","extern":"1","doi":"10.1109/test.2003.1270870","department":[{"_id":"48"}]}