{"user_id":"209","language":[{"iso":"eng"}],"publisher":"IEEE","department":[{"_id":"48"}],"type":"journal_article","author":[{"last_name":"Hellebrand","full_name":"Hellebrand, Sybille","id":"209","orcid":"0000-0002-3717-3939","first_name":"Sybille"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"},{"first_name":"Alexander","full_name":"A. Ivaniuk, Alexander","last_name":"A. Ivaniuk"},{"first_name":"Yuri","last_name":"V. Klimets","full_name":"V. Klimets, Yuri"},{"last_name":"N. Yarmolik","full_name":"N. Yarmolik, Vyacheslav","first_name":"Vyacheslav"}],"volume":51,"issue":"7","year":"2002","title":"Efficient Online and Offline Testing of Embedded DRAMs","date_created":"2019-08-28T10:23:19Z","extern":"1","status":"public","doi":"10.1109/tc.2002.1017700","date_updated":"2022-05-11T16:42:52Z","page":"801-809","publication":"IEEE Transactions on Computers","_id":"13003","citation":{"mla":"Hellebrand, Sybille, et al. “Efficient Online and Offline Testing of Embedded DRAMs.” <i>IEEE Transactions on Computers</i>, vol. 51, no. 7, IEEE, 2002, pp. 801–09, doi:<a href=\"https://doi.org/10.1109/tc.2002.1017700\">10.1109/tc.2002.1017700</a>.","ama":"Hellebrand S, Wunderlich H-J, A. Ivaniuk A, V. Klimets Y, N. Yarmolik V. Efficient Online and Offline Testing of Embedded DRAMs. <i>IEEE Transactions on Computers</i>. 2002;51(7):801-809. doi:<a href=\"https://doi.org/10.1109/tc.2002.1017700\">10.1109/tc.2002.1017700</a>","bibtex":"@article{Hellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_2002, title={Efficient Online and Offline Testing of Embedded DRAMs}, volume={51}, DOI={<a href=\"https://doi.org/10.1109/tc.2002.1017700\">10.1109/tc.2002.1017700</a>}, number={7}, journal={IEEE Transactions on Computers}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}, year={2002}, pages={801–809} }","short":"S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, V. N. Yarmolik, IEEE Transactions on Computers 51 (2002) 801–809.","apa":"Hellebrand, S., Wunderlich, H.-J., A. Ivaniuk, A., V. Klimets, Y., &#38; N. Yarmolik, V. (2002). Efficient Online and Offline Testing of Embedded DRAMs. <i>IEEE Transactions on Computers</i>, <i>51</i>(7), 801–809. <a href=\"https://doi.org/10.1109/tc.2002.1017700\">https://doi.org/10.1109/tc.2002.1017700</a>","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, and Vyacheslav N. Yarmolik. “Efficient Online and Offline Testing of Embedded DRAMs.” <i>IEEE Transactions on Computers</i> 51, no. 7 (2002): 801–9. <a href=\"https://doi.org/10.1109/tc.2002.1017700\">https://doi.org/10.1109/tc.2002.1017700</a>.","ieee":"S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, and V. N. Yarmolik, “Efficient Online and Offline Testing of Embedded DRAMs,” <i>IEEE Transactions on Computers</i>, vol. 51, no. 7, pp. 801–809, 2002, doi: <a href=\"https://doi.org/10.1109/tc.2002.1017700\">10.1109/tc.2002.1017700</a>."},"intvolume":"        51"}