{"_id":"13004","publication":"IEEE International Test Conference (ITC'01)","page":"894-902","citation":{"mla":"Liang, Hua-Guo, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” <i>IEEE International Test Conference (ITC’01)</i>, IEEE, 2001, pp. 894–902, doi:<a href=\"https://doi.org/10.1109/test.2001.966712\">10.1109/test.2001.966712</a>.","bibtex":"@inproceedings{Liang_Hellebrand_Wunderlich_2001, place={Baltimore, MD, USA}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, DOI={<a href=\"https://doi.org/10.1109/test.2001.966712\">10.1109/test.2001.966712</a>}, booktitle={IEEE International Test Conference (ITC’01)}, publisher={IEEE}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001}, pages={894–902} }","apa":"Liang, H.-G., Hellebrand, S., &#38; Wunderlich, H.-J. (2001). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. <i>IEEE International Test Conference (ITC’01)</i>, 894–902. <a href=\"https://doi.org/10.1109/test.2001.966712\">https://doi.org/10.1109/test.2001.966712</a>","ieee":"H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST,” in <i>IEEE International Test Conference (ITC’01)</i>, 2001, pp. 894–902, doi: <a href=\"https://doi.org/10.1109/test.2001.966712\">10.1109/test.2001.966712</a>.","ama":"Liang H-G, Hellebrand S, Wunderlich H-J. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. In: <i>IEEE International Test Conference (ITC’01)</i>. IEEE; 2001:894-902. doi:<a href=\"https://doi.org/10.1109/test.2001.966712\">10.1109/test.2001.966712</a>","chicago":"Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” In <i>IEEE International Test Conference (ITC’01)</i>, 894–902. Baltimore, MD, USA: IEEE, 2001. <a href=\"https://doi.org/10.1109/test.2001.966712\">https://doi.org/10.1109/test.2001.966712</a>.","short":"H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’01), IEEE, Baltimore, MD, USA, 2001, pp. 894–902."},"title":"Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST","author":[{"full_name":"Liang, Hua-Guo","last_name":"Liang","first_name":"Hua-Guo"},{"orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand","id":"209","full_name":"Hellebrand, Sybille"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"publisher":"IEEE","year":"2001","user_id":"209","department":[{"_id":"48"}],"place":"Baltimore, MD, USA","extern":"1","date_created":"2019-08-28T10:23:20Z","language":[{"iso":"eng"}],"date_updated":"2022-05-11T16:44:35Z","type":"conference","status":"public","doi":"10.1109/test.2001.966712"}