{"language":[{"iso":"eng"}],"user_id":"209","extern":"1","date_created":"2019-08-28T10:23:20Z","status":"public","year":"2001","date_updated":"2022-05-11T16:44:35Z","doi":"10.1109/test.2001.966712","page":"894-902","_id":"13004","department":[{"_id":"48"}],"citation":{"ieee":"H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST,” in IEEE International Test Conference (ITC’01), 2001, pp. 894–902, doi: 10.1109/test.2001.966712.","mla":"Liang, Hua-Guo, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” IEEE International Test Conference (ITC’01), IEEE, 2001, pp. 894–902, doi:10.1109/test.2001.966712.","short":"H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’01), IEEE, Baltimore, MD, USA, 2001, pp. 894–902.","ama":"Liang H-G, Hellebrand S, Wunderlich H-J. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. In: IEEE International Test Conference (ITC’01). IEEE; 2001:894-902. doi:10.1109/test.2001.966712","chicago":"Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” In IEEE International Test Conference (ITC’01), 894–902. Baltimore, MD, USA: IEEE, 2001. https://doi.org/10.1109/test.2001.966712.","apa":"Liang, H.-G., Hellebrand, S., & Wunderlich, H.-J. (2001). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE International Test Conference (ITC’01), 894–902. https://doi.org/10.1109/test.2001.966712","bibtex":"@inproceedings{Liang_Hellebrand_Wunderlich_2001, place={Baltimore, MD, USA}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, DOI={10.1109/test.2001.966712}, booktitle={IEEE International Test Conference (ITC’01)}, publisher={IEEE}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001}, pages={894–902} }"},"type":"conference","publication":"IEEE International Test Conference (ITC'01)","place":"Baltimore, MD, USA","publisher":"IEEE","title":"Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST","author":[{"full_name":"Liang, Hua-Guo","last_name":"Liang","first_name":"Hua-Guo"},{"full_name":"Hellebrand, Sybille","id":"209","last_name":"Hellebrand","first_name":"Sybille","orcid":"0000-0002-3717-3939"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}]}