{"type":"conference","page":"778-784","title":"A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters","date_created":"2019-08-28T10:24:38Z","publication":"IEEE International Test Conference (ITC'00)","status":"public","author":[{"id":"209","first_name":"Sybille","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","last_name":"Hellebrand"},{"last_name":"Liang","full_name":"Liang, Hua-Guo","first_name":"Hua-Guo"},{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"}],"date_updated":"2022-05-11T16:47:22Z","year":"2000","_id":"13005","language":[{"iso":"eng"}],"extern":"1","doi":"10.1109/test.2000.894274","department":[{"_id":"48"}],"user_id":"209","place":"Atlantic City, NJ, USA","publisher":"IEEE","citation":{"ieee":"S. Hellebrand, H.-G. Liang, and H.-J. Wunderlich, “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters,” in <i>IEEE International Test Conference (ITC’00)</i>, 2000, pp. 778–784, doi: <a href=\"https://doi.org/10.1109/test.2000.894274\">10.1109/test.2000.894274</a>.","apa":"Hellebrand, S., Liang, H.-G., &#38; Wunderlich, H.-J. (2000). A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. <i>IEEE International Test Conference (ITC’00)</i>, 778–784. <a href=\"https://doi.org/10.1109/test.2000.894274\">https://doi.org/10.1109/test.2000.894274</a>","mla":"Hellebrand, Sybille, et al. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” <i>IEEE International Test Conference (ITC’00)</i>, IEEE, 2000, pp. 778–84, doi:<a href=\"https://doi.org/10.1109/test.2000.894274\">10.1109/test.2000.894274</a>.","ama":"Hellebrand S, Liang H-G, Wunderlich H-J. A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. In: <i>IEEE International Test Conference (ITC’00)</i>. IEEE; 2000:778-784. doi:<a href=\"https://doi.org/10.1109/test.2000.894274\">10.1109/test.2000.894274</a>","bibtex":"@inproceedings{Hellebrand_Liang_Wunderlich_2000, place={Atlantic City, NJ, USA}, title={A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}, DOI={<a href=\"https://doi.org/10.1109/test.2000.894274\">10.1109/test.2000.894274</a>}, booktitle={IEEE International Test Conference (ITC’00)}, publisher={IEEE}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2000}, pages={778–784} }","chicago":"Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” In <i>IEEE International Test Conference (ITC’00)</i>, 778–84. Atlantic City, NJ, USA: IEEE, 2000. <a href=\"https://doi.org/10.1109/test.2000.894274\">https://doi.org/10.1109/test.2000.894274</a>.","short":"S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’00), IEEE, Atlantic City, NJ, USA, 2000, pp. 778–784."}}