[{"place":"Dana Point, CA, USA","dc":{"title":["Error Detecting Refreshment for Embedded DRAMs"],"source":["Hellebrand S, Wunderlich H-J, A. Ivaniuk A, V. Klimets Y, N. Yarmolik V. Error Detecting Refreshment for Embedded DRAMs. In: 17th IEEE VLSI Test Symposium (VTS’99). IEEE; 1999:384-390. doi:10.1109/vtest.1999.766693"],"creator":["Hellebrand, Sybille","Wunderlich, Hans-Joachim","A. Ivaniuk, Alexander","V. Klimets, Yuri","N. Yarmolik, Vyacheslav"],"identifier":["https://ris.uni-paderborn.de/record/13006"],"relation":["info:eu-repo/semantics/altIdentifier/doi/10.1109/vtest.1999.766693"],"date":["1999"],"language":["eng"],"type":["info:eu-repo/semantics/conferenceObject","doc-type:conferenceObject","text","http://purl.org/coar/resource_type/c_5794"],"rights":["info:eu-repo/semantics/closedAccess"],"publisher":["IEEE"]},"department":[{"_id":"48","tree":[{"_id":"3"},{"_id":"34"},{"_id":"44"},{"_id":"43"}]}],"dini_type":"doc-type:conferenceObject","date_updated":"2022-05-11T16:48:03Z","creator":{"id":"659","login":"ibers"},"message":"(Cat. No. PR 00146)","language":[{}],"extern":"1","user_id":"209","publication":"17th IEEE VLSI Test Symposium (VTS'99)","author":[{"orcid":"0000-0002-3717-3939","first_name":"Sybille","id":"209","last_name":"Hellebrand"},{"last_name":"Wunderlich","first_name":"Hans-Joachim"},{"last_name":"A. Ivaniuk","first_name":"Alexander"},{"last_name":"V. Klimets","first_name":"Yuri"},{"last_name":"N. Yarmolik","first_name":"Vyacheslav"}],"date_created":"2019-08-28T10:24:39Z","status":"public","_id":"13006","page":"384-390","uri_base":"https://ris.uni-paderborn.de","citation":{"ieee":"S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, and V. N. Yarmolik, “Error Detecting Refreshment for Embedded DRAMs,” in 17th IEEE VLSI Test Symposium (VTS’99), 1999, pp. 384–390, doi: 10.1109/vtest.1999.766693.","short":"S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, V. N. Yarmolik, in: 17th IEEE VLSI Test Symposium (VTS’99), IEEE, Dana Point, CA, USA, 1999, pp. 384–390.","bibtex":"@inproceedings{Hellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_1999, place={Dana Point, CA, USA}, title={Error Detecting Refreshment for Embedded DRAMs}, DOI={10.1109/vtest.1999.766693}, booktitle={17th IEEE VLSI Test Symposium (VTS’99)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}, year={1999}, pages={384–390} }","mla":"Hellebrand, Sybille, et al. “Error Detecting Refreshment for Embedded DRAMs.” 17th IEEE VLSI Test Symposium (VTS’99), IEEE, 1999, pp. 384–90, doi:10.1109/vtest.1999.766693.","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, and Vyacheslav N. Yarmolik. “Error Detecting Refreshment for Embedded DRAMs.” In 17th IEEE VLSI Test Symposium (VTS’99), 384–90. Dana Point, CA, USA: IEEE, 1999. https://doi.org/10.1109/vtest.1999.766693.","apa":"Hellebrand, S., Wunderlich, H.-J., A. Ivaniuk, A., V. Klimets, Y., & N. Yarmolik, V. (1999). Error Detecting Refreshment for Embedded DRAMs. 17th IEEE VLSI Test Symposium (VTS’99), 384–390. https://doi.org/10.1109/vtest.1999.766693"},"type":"conference"}]