{"language":[{"iso":"eng"}],"page":"384-390","type":"conference","date_updated":"2022-05-11T16:48:03Z","publication":"17th IEEE VLSI Test Symposium (VTS'99)","doi":"10.1109/vtest.1999.766693","extern":"1","author":[{"orcid":"0000-0002-3717-3939","first_name":"Sybille","id":"209","last_name":"Hellebrand","full_name":"Hellebrand, Sybille"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"},{"full_name":"A. Ivaniuk, Alexander","last_name":"A. Ivaniuk","first_name":"Alexander"},{"first_name":"Yuri","last_name":"V. Klimets","full_name":"V. Klimets, Yuri"},{"full_name":"N. Yarmolik, Vyacheslav","last_name":"N. Yarmolik","first_name":"Vyacheslav"}],"publisher":"IEEE","status":"public","year":"1999","place":"Dana Point, CA, USA","user_id":"209","citation":{"chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, and Vyacheslav N. Yarmolik. “Error Detecting Refreshment for Embedded DRAMs.” In <i>17th IEEE VLSI Test Symposium (VTS’99)</i>, 384–90. Dana Point, CA, USA: IEEE, 1999. <a href=\"https://doi.org/10.1109/vtest.1999.766693\">https://doi.org/10.1109/vtest.1999.766693</a>.","apa":"Hellebrand, S., Wunderlich, H.-J., A. Ivaniuk, A., V. Klimets, Y., &#38; N. Yarmolik, V. (1999). Error Detecting Refreshment for Embedded DRAMs. <i>17th IEEE VLSI Test Symposium (VTS’99)</i>, 384–390. <a href=\"https://doi.org/10.1109/vtest.1999.766693\">https://doi.org/10.1109/vtest.1999.766693</a>","short":"S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, V. N. Yarmolik, in: 17th IEEE VLSI Test Symposium (VTS’99), IEEE, Dana Point, CA, USA, 1999, pp. 384–390.","ieee":"S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, and V. N. Yarmolik, “Error Detecting Refreshment for Embedded DRAMs,” in <i>17th IEEE VLSI Test Symposium (VTS’99)</i>, 1999, pp. 384–390, doi: <a href=\"https://doi.org/10.1109/vtest.1999.766693\">10.1109/vtest.1999.766693</a>.","ama":"Hellebrand S, Wunderlich H-J, A. Ivaniuk A, V. Klimets Y, N. Yarmolik V. Error Detecting Refreshment for Embedded DRAMs. In: <i>17th IEEE VLSI Test Symposium (VTS’99)</i>. IEEE; 1999:384-390. doi:<a href=\"https://doi.org/10.1109/vtest.1999.766693\">10.1109/vtest.1999.766693</a>","mla":"Hellebrand, Sybille, et al. “Error Detecting Refreshment for Embedded DRAMs.” <i>17th IEEE VLSI Test Symposium (VTS’99)</i>, IEEE, 1999, pp. 384–90, doi:<a href=\"https://doi.org/10.1109/vtest.1999.766693\">10.1109/vtest.1999.766693</a>.","bibtex":"@inproceedings{Hellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_1999, place={Dana Point, CA, USA}, title={Error Detecting Refreshment for Embedded DRAMs}, DOI={<a href=\"https://doi.org/10.1109/vtest.1999.766693\">10.1109/vtest.1999.766693</a>}, booktitle={17th IEEE VLSI Test Symposium (VTS’99)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}, year={1999}, pages={384–390} }"},"date_created":"2019-08-28T10:24:39Z","_id":"13006","title":"Error Detecting Refreshment for Embedded DRAMs","department":[{"_id":"48"}]}