{"publisher":"IEEE","date_updated":"2022-05-11T16:51:22Z","date_created":"2019-08-28T10:24:40Z","author":[{"first_name":"Andre","full_name":"Hertwig, Andre","last_name":"Hertwig"},{"last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209","first_name":"Sybille"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"title":"Fast Self-Recovering Controllers","doi":"10.1109/vtest.1998.670883","place":"Monterey, CA, USA","year":"1998","page":"296-302","citation":{"ama":"Hertwig A, Hellebrand S, Wunderlich H-J. Fast Self-Recovering Controllers. In: 16th IEEE VLSI Test Symposium (VTS’98). IEEE; 1998:296-302. doi:10.1109/vtest.1998.670883","chicago":"Hertwig, Andre, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Fast Self-Recovering Controllers.” In 16th IEEE VLSI Test Symposium (VTS’98), 296–302. Monterey, CA, USA: IEEE, 1998. https://doi.org/10.1109/vtest.1998.670883.","ieee":"A. Hertwig, S. Hellebrand, and H.-J. Wunderlich, “Fast Self-Recovering Controllers,” in 16th IEEE VLSI Test Symposium (VTS’98), 1998, pp. 296–302, doi: 10.1109/vtest.1998.670883.","mla":"Hertwig, Andre, et al. “Fast Self-Recovering Controllers.” 16th IEEE VLSI Test Symposium (VTS’98), IEEE, 1998, pp. 296–302, doi:10.1109/vtest.1998.670883.","short":"A. Hertwig, S. Hellebrand, H.-J. Wunderlich, in: 16th IEEE VLSI Test Symposium (VTS’98), IEEE, Monterey, CA, USA, 1998, pp. 296–302.","bibtex":"@inproceedings{Hertwig_Hellebrand_Wunderlich_1998, place={Monterey, CA, USA}, title={Fast Self-Recovering Controllers}, DOI={10.1109/vtest.1998.670883}, booktitle={16th IEEE VLSI Test Symposium (VTS’98)}, publisher={IEEE}, author={Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998}, pages={296–302} }","apa":"Hertwig, A., Hellebrand, S., & Wunderlich, H.-J. (1998). Fast Self-Recovering Controllers. 16th IEEE VLSI Test Symposium (VTS’98), 296–302. https://doi.org/10.1109/vtest.1998.670883"},"_id":"13007","department":[{"_id":"48"}],"user_id":"209","language":[{"iso":"eng"}],"extern":"1","publication":"16th IEEE VLSI Test Symposium (VTS'98)","type":"conference","status":"public"}