{"department":[{"_id":"48"}],"type":"conference","citation":{"short":"S. Hellebrand, H.-J. Wunderlich, V. N. Yarmolik, in: Design Automation and Test in Europe (DATE’98), Paris, France, 1998, pp. 173–179.","ieee":"S. Hellebrand, H.-J. Wunderlich, and V. N. Yarmolik, “Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs,” in <i>Design Automation and Test in Europe (DATE’98)</i>, 1998, pp. 173–179, doi: <a href=\"https://doi.org/10.1109/date.1998.655853\">10.1109/date.1998.655853</a>.","bibtex":"@inproceedings{Hellebrand_Wunderlich_N. Yarmolik_1998, place={Paris, France}, title={Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs}, DOI={<a href=\"https://doi.org/10.1109/date.1998.655853\">10.1109/date.1998.655853</a>}, booktitle={Design Automation and Test in Europe (DATE’98)}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}, year={1998}, pages={173–179} }","ama":"Hellebrand S, Wunderlich H-J, N. Yarmolik V. Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs. In: <i>Design Automation and Test in Europe (DATE’98)</i>. ; 1998:173-179. doi:<a href=\"https://doi.org/10.1109/date.1998.655853\">10.1109/date.1998.655853</a>","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Vyacheslav N. Yarmolik. “Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs.” In <i>Design Automation and Test in Europe (DATE’98)</i>, 173–79. Paris, France, 1998. <a href=\"https://doi.org/10.1109/date.1998.655853\">https://doi.org/10.1109/date.1998.655853</a>.","mla":"Hellebrand, Sybille, et al. “Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs.” <i>Design Automation and Test in Europe (DATE’98)</i>, 1998, pp. 173–79, doi:<a href=\"https://doi.org/10.1109/date.1998.655853\">10.1109/date.1998.655853</a>.","apa":"Hellebrand, S., Wunderlich, H.-J., &#38; N. Yarmolik, V. (1998). Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs. <i>Design Automation and Test in Europe (DATE’98)</i>, 173–179. <a href=\"https://doi.org/10.1109/date.1998.655853\">https://doi.org/10.1109/date.1998.655853</a>"},"author":[{"orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","first_name":"Sybille","id":"209"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"},{"full_name":"N. Yarmolik, Vyacheslav","last_name":"N. Yarmolik","first_name":"Vyacheslav"}],"year":"1998","user_id":"209","doi":"10.1109/date.1998.655853","date_created":"2019-08-28T10:25:39Z","_id":"13008","status":"public","publication":"Design Automation and Test in Europe (DATE'98)","extern":"1","title":"Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs","date_updated":"2022-05-11T16:50:33Z","language":[{"iso":"eng"}],"place":"Paris, France","page":"173-179"}