{"publisher":"IEEE","extern":"1","publication":"34th ACM/IEEE Design Automation Conference (DAC'97)","place":"Anaheim, CA, USA","department":[{"_id":"48"}],"author":[{"first_name":"Kun-Han","last_name":"Tsai","full_name":"Tsai, Kun-Han"},{"first_name":"Sybille","last_name":"Hellebrand","id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939"},{"first_name":"Malgorzata","last_name":"Marek-Sadowska","full_name":"Marek-Sadowska, Malgorzata"},{"first_name":"Janusz","full_name":"Rajski, Janusz","last_name":"Rajski"}],"title":"STARBIST: Scan Autocorrelated Random Pattern Generation","citation":{"ieee":"K.-H. Tsai, S. Hellebrand, M. Marek-Sadowska, and J. Rajski, “STARBIST: Scan Autocorrelated Random Pattern Generation,” 1997, doi: <a href=\"https://doi.org/10.1109/dac.1997.597194\">10.1109/dac.1997.597194</a>.","chicago":"Tsai, Kun-Han, Sybille Hellebrand, Malgorzata Marek-Sadowska, and Janusz Rajski. “STARBIST: Scan Autocorrelated Random Pattern Generation.” In <i>34th ACM/IEEE Design Automation Conference (DAC’97)</i>. Anaheim, CA, USA: IEEE, 1997. <a href=\"https://doi.org/10.1109/dac.1997.597194\">https://doi.org/10.1109/dac.1997.597194</a>.","ama":"Tsai K-H, Hellebrand S, Marek-Sadowska M, Rajski J. STARBIST: Scan Autocorrelated Random Pattern Generation. In: <i>34th ACM/IEEE Design Automation Conference (DAC’97)</i>. IEEE; 1997. doi:<a href=\"https://doi.org/10.1109/dac.1997.597194\">10.1109/dac.1997.597194</a>","bibtex":"@inproceedings{Tsai_Hellebrand_Marek-Sadowska_Rajski_1997, place={Anaheim, CA, USA}, title={STARBIST: Scan Autocorrelated Random Pattern Generation}, DOI={<a href=\"https://doi.org/10.1109/dac.1997.597194\">10.1109/dac.1997.597194</a>}, booktitle={34th ACM/IEEE Design Automation Conference (DAC’97)}, publisher={IEEE}, author={Tsai, Kun-Han and Hellebrand, Sybille and Marek-Sadowska, Malgorzata and Rajski, Janusz}, year={1997} }","short":"K.-H. Tsai, S. Hellebrand, M. Marek-Sadowska, J. Rajski, in: 34th ACM/IEEE Design Automation Conference (DAC’97), IEEE, Anaheim, CA, USA, 1997.","apa":"Tsai, K.-H., Hellebrand, S., Marek-Sadowska, M., &#38; Rajski, J. (1997). STARBIST: Scan Autocorrelated Random Pattern Generation. <i>34th ACM/IEEE Design Automation Conference (DAC’97)</i>. <a href=\"https://doi.org/10.1109/dac.1997.597194\">https://doi.org/10.1109/dac.1997.597194</a>","mla":"Tsai, Kun-Han, et al. “STARBIST: Scan Autocorrelated Random Pattern Generation.” <i>34th ACM/IEEE Design Automation Conference (DAC’97)</i>, IEEE, 1997, doi:<a href=\"https://doi.org/10.1109/dac.1997.597194\">10.1109/dac.1997.597194</a>."},"status":"public","doi":"10.1109/dac.1997.597194","user_id":"209","_id":"13009","date_created":"2019-08-28T10:25:41Z","language":[{"iso":"eng"}],"year":"1997","type":"conference","date_updated":"2022-05-11T16:53:52Z"}