{"user_id":"209","department":[{"_id":"48"}],"place":"Washington, DC, USA","title":"Mixed-Mode BIST Using Embedded Processors","year":"1996","author":[{"orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","first_name":"Sybille","id":"209"},{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"},{"first_name":"Andre","full_name":"Hertwig, Andre","last_name":"Hertwig"}],"_id":"13010","publication":"IEEE International Test Conference (ITC'96)","language":[{"iso":"eng"}],"publisher":"IEEE","citation":{"ieee":"S. Hellebrand, H.-J. Wunderlich, and A. Hertwig, “Mixed-Mode BIST Using Embedded Processors,” in <i>IEEE International Test Conference (ITC’96)</i>, 1996, pp. 195–204, doi: <a href=\"https://doi.org/10.1109/test.1996.556962\">10.1109/test.1996.556962</a>.","bibtex":"@inproceedings{Hellebrand_Wunderlich_Hertwig_1996, place={Washington, DC, USA}, title={Mixed-Mode BIST Using Embedded Processors}, DOI={<a href=\"https://doi.org/10.1109/test.1996.556962\">10.1109/test.1996.556962</a>}, booktitle={IEEE International Test Conference (ITC’96)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}, year={1996}, pages={195–204} }","apa":"Hellebrand, S., Wunderlich, H.-J., &#38; Hertwig, A. (1996). Mixed-Mode BIST Using Embedded Processors. <i>IEEE International Test Conference (ITC’96)</i>, 195–204. <a href=\"https://doi.org/10.1109/test.1996.556962\">https://doi.org/10.1109/test.1996.556962</a>","mla":"Hellebrand, Sybille, et al. “Mixed-Mode BIST Using Embedded Processors.” <i>IEEE International Test Conference (ITC’96)</i>, IEEE, 1996, pp. 195–204, doi:<a href=\"https://doi.org/10.1109/test.1996.556962\">10.1109/test.1996.556962</a>.","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Andre Hertwig. “Mixed-Mode BIST Using Embedded Processors.” In <i>IEEE International Test Conference (ITC’96)</i>, 195–204. Washington, DC, USA: IEEE, 1996. <a href=\"https://doi.org/10.1109/test.1996.556962\">https://doi.org/10.1109/test.1996.556962</a>.","short":"S. Hellebrand, H.-J. Wunderlich, A. Hertwig, in: IEEE International Test Conference (ITC’96), IEEE, Washington, DC, USA, 1996, pp. 195–204.","ama":"Hellebrand S, Wunderlich H-J, Hertwig A. Mixed-Mode BIST Using Embedded Processors. In: <i>IEEE International Test Conference (ITC’96)</i>. IEEE; 1996:195-204. doi:<a href=\"https://doi.org/10.1109/test.1996.556962\">10.1109/test.1996.556962</a>"},"date_updated":"2022-05-11T16:54:33Z","extern":"1","date_created":"2019-08-28T10:25:42Z","type":"conference","doi":"10.1109/test.1996.556962","status":"public","page":"195-204"}