{"doi":"10.1109/test.1996.556962","department":[{"_id":"48"}],"place":"Washington, DC, USA","publisher":"IEEE","citation":{"apa":"Hellebrand, S., Wunderlich, H.-J., &#38; Hertwig, A. (1996). Mixed-Mode BIST Using Embedded Processors. <i>IEEE International Test Conference (ITC’96)</i>, 195–204. <a href=\"https://doi.org/10.1109/test.1996.556962\">https://doi.org/10.1109/test.1996.556962</a>","ieee":"S. Hellebrand, H.-J. Wunderlich, and A. Hertwig, “Mixed-Mode BIST Using Embedded Processors,” in <i>IEEE International Test Conference (ITC’96)</i>, 1996, pp. 195–204, doi: <a href=\"https://doi.org/10.1109/test.1996.556962\">10.1109/test.1996.556962</a>.","mla":"Hellebrand, Sybille, et al. “Mixed-Mode BIST Using Embedded Processors.” <i>IEEE International Test Conference (ITC’96)</i>, IEEE, 1996, pp. 195–204, doi:<a href=\"https://doi.org/10.1109/test.1996.556962\">10.1109/test.1996.556962</a>.","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Andre Hertwig. “Mixed-Mode BIST Using Embedded Processors.” In <i>IEEE International Test Conference (ITC’96)</i>, 195–204. Washington, DC, USA: IEEE, 1996. <a href=\"https://doi.org/10.1109/test.1996.556962\">https://doi.org/10.1109/test.1996.556962</a>.","bibtex":"@inproceedings{Hellebrand_Wunderlich_Hertwig_1996, place={Washington, DC, USA}, title={Mixed-Mode BIST Using Embedded Processors}, DOI={<a href=\"https://doi.org/10.1109/test.1996.556962\">10.1109/test.1996.556962</a>}, booktitle={IEEE International Test Conference (ITC’96)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}, year={1996}, pages={195–204} }","ama":"Hellebrand S, Wunderlich H-J, Hertwig A. Mixed-Mode BIST Using Embedded Processors. In: <i>IEEE International Test Conference (ITC’96)</i>. IEEE; 1996:195-204. doi:<a href=\"https://doi.org/10.1109/test.1996.556962\">10.1109/test.1996.556962</a>","short":"S. Hellebrand, H.-J. Wunderlich, A. Hertwig, in: IEEE International Test Conference (ITC’96), IEEE, Washington, DC, USA, 1996, pp. 195–204."},"user_id":"209","type":"conference","page":"195-204","publication":"IEEE International Test Conference (ITC'96)","date_created":"2019-08-28T10:25:42Z","title":"Mixed-Mode BIST Using Embedded Processors","date_updated":"2022-05-11T16:54:33Z","status":"public","author":[{"id":"209","orcid":"0000-0002-3717-3939","first_name":"Sybille","full_name":"Hellebrand, Sybille","last_name":"Hellebrand"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"},{"full_name":"Hertwig, Andre","last_name":"Hertwig","first_name":"Andre"}],"extern":"1","language":[{"iso":"eng"}],"_id":"13010","year":"1996"}