---
res:
  bibo_authorlist:
  - foaf_Person:
      foaf_givenName: Sybille
      foaf_name: Hellebrand, Sybille
      foaf_surname: Hellebrand
      foaf_workInfoHomepage: http://www.librecat.org/personId=209
    orcid: 0000-0002-3717-3939
  - foaf_Person:
      foaf_givenName: Janusz
      foaf_name: Rajski, Janusz
      foaf_surname: Rajski
  - foaf_Person:
      foaf_givenName: Steffen
      foaf_name: Tarnick, Steffen
      foaf_surname: Tarnick
  - foaf_Person:
      foaf_givenName: Srikanth
      foaf_name: Venkataraman, Srikanth
      foaf_surname: Venkataraman
  - foaf_Person:
      foaf_givenName: B.
      foaf_name: Courtois, B.
      foaf_surname: Courtois
  bibo_doi: 10.1109/12.364534
  bibo_issue: '2'
  bibo_volume: 44
  dct_date: 1995^xs_gYear
  dct_language: eng
  dct_publisher: IEEE@
  dct_title: Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial
    Linear Feedback Shift Registers@
...