@article{13011,
  author       = {{Hellebrand, Sybille and Rajski, Janusz and Tarnick, Steffen and Venkataraman, Srikanth and Courtois, B.}},
  journal      = {{IEEE Transactions on Computers}},
  number       = {{2}},
  pages        = {{223--233}},
  publisher    = {{IEEE}},
  title        = {{{Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers}}},
  doi          = {{10.1109/12.364534}},
  volume       = {{44}},
  year         = {{1995}},
}