article Sybille Hellebrand author 2090000-0002-3717-3939 Janusz Rajski author Steffen Tarnick author Srikanth Venkataraman author B. Courtois author 48 department IEEE1995 eng 10.1109/12.364534 442223-233 yes S. Hellebrand, J. Rajski, S. Tarnick, S. Venkataraman, and B. Courtois, “Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers,” <i>IEEE Transactions on Computers</i>, vol. 44, no. 2, pp. 223–233, 1995, doi: <a href="https://doi.org/10.1109/12.364534">10.1109/12.364534</a>. Hellebrand, Sybille, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, and B. Courtois. “Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” <i>IEEE Transactions on Computers</i> 44, no. 2 (1995): 223–33. <a href="https://doi.org/10.1109/12.364534">https://doi.org/10.1109/12.364534</a>. Hellebrand S, Rajski J, Tarnick S, Venkataraman S, Courtois B. Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. <i>IEEE Transactions on Computers</i>. 1995;44(2):223-233. doi:<a href="https://doi.org/10.1109/12.364534">10.1109/12.364534</a> @article{Hellebrand_Rajski_Tarnick_Venkataraman_Courtois_1995, title={Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers}, volume={44}, DOI={<a href="https://doi.org/10.1109/12.364534">10.1109/12.364534</a>}, number={2}, journal={IEEE Transactions on Computers}, publisher={IEEE}, author={Hellebrand, Sybille and Rajski, Janusz and Tarnick, Steffen and Venkataraman, Srikanth and Courtois, B.}, year={1995}, pages={223–233} } S. Hellebrand, J. Rajski, S. Tarnick, S. Venkataraman, B. Courtois, IEEE Transactions on Computers 44 (1995) 223–233. Hellebrand, Sybille, et al. “Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” <i>IEEE Transactions on Computers</i>, vol. 44, no. 2, IEEE, 1995, pp. 223–33, doi:<a href="https://doi.org/10.1109/12.364534">10.1109/12.364534</a>. Hellebrand, S., Rajski, J., Tarnick, S., Venkataraman, S., &#38; Courtois, B. (1995). Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. <i>IEEE Transactions on Computers</i>, <i>44</i>(2), 223–233. <a href="https://doi.org/10.1109/12.364534">https://doi.org/10.1109/12.364534</a> 130112019-08-28T10:26:37Z2022-05-11T16:55:15Z