{"publisher":"IEEE","extern":"1","department":[{"_id":"48"}],"publication":"ACM/IEEE International Conference on Computer Aided Design (ICCAD'95)","place":"San Jose, CA, USA","title":"Pattern Generation for a Deterministic BIST Scheme","author":[{"first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand"},{"first_name":"Birgit","last_name":"Reeb","full_name":"Reeb, Birgit"},{"full_name":"Tarnick, Steffen","last_name":"Tarnick","first_name":"Steffen"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"citation":{"short":"S. Hellebrand, B. Reeb, S. Tarnick, H.-J. Wunderlich, in: ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), IEEE, San Jose, CA, USA, 1995, pp. 88–94.","apa":"Hellebrand, S., Reeb, B., Tarnick, S., & Wunderlich, H.-J. (1995). Pattern Generation for a Deterministic BIST Scheme. ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), 88–94. https://doi.org/10.1109/iccad.1995.479997","mla":"Hellebrand, Sybille, et al. “Pattern Generation for a Deterministic BIST Scheme.” ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), IEEE, 1995, pp. 88–94, doi:10.1109/iccad.1995.479997.","ama":"Hellebrand S, Reeb B, Tarnick S, Wunderlich H-J. Pattern Generation for a Deterministic BIST Scheme. In: ACM/IEEE International Conference on Computer Aided Design (ICCAD’95). IEEE; 1995:88-94. doi:10.1109/iccad.1995.479997","bibtex":"@inproceedings{Hellebrand_Reeb_Tarnick_Wunderlich_1995, place={San Jose, CA, USA}, title={Pattern Generation for a Deterministic BIST Scheme}, DOI={10.1109/iccad.1995.479997}, booktitle={ACM/IEEE International Conference on Computer Aided Design (ICCAD’95)}, publisher={IEEE}, author={Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim}, year={1995}, pages={88–94} }","ieee":"S. Hellebrand, B. Reeb, S. Tarnick, and H.-J. Wunderlich, “Pattern Generation for a Deterministic BIST Scheme,” in ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), 1995, pp. 88–94, doi: 10.1109/iccad.1995.479997.","chicago":"Hellebrand, Sybille, Birgit Reeb, Steffen Tarnick, and Hans-Joachim Wunderlich. “Pattern Generation for a Deterministic BIST Scheme.” In ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), 88–94. San Jose, CA, USA: IEEE, 1995. https://doi.org/10.1109/iccad.1995.479997."},"status":"public","doi":"10.1109/iccad.1995.479997","user_id":"209","_id":"13012","date_created":"2019-08-28T10:26:38Z","language":[{"iso":"eng"}],"type":"conference","page":"88-94","year":"1995","date_updated":"2022-05-11T16:55:51Z"}