[{"citation":{"mla":"Hellebrand, Sybille, et al. “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” <i>{IEEE International Test Conference (ITC’92)}</i>, {IEEE}, 1992, pp. 120–29, doi:<a href=\"https://doi.org/10.1109/test.1992.527812\">10.1109/test.1992.527812</a>.","ieee":"S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers,” in <i>{IEEE International Test Conference (ITC’92)}</i>, 1992, pp. 120–129.","apa":"Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1992). Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. In <i>{IEEE International Test Conference (ITC’92)}</i> (pp. 120–129). Baltimore, MD, USA: {IEEE}. <a href=\"https://doi.org/10.1109/test.1992.527812\">https://doi.org/10.1109/test.1992.527812</a>","short":"S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, in: {IEEE International Test Conference (ITC’92)}, {IEEE}, Baltimore, MD, USA, 1992, pp. 120–129.","ama":"Hellebrand S, Tarnick S, Rajski J, Courtois B. Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. In: <i>{IEEE International Test Conference (ITC’92)}</i>. Baltimore, MD, USA: {IEEE}; 1992:120-129. doi:<a href=\"https://doi.org/10.1109/test.1992.527812\">10.1109/test.1992.527812</a>","chicago":"Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois. “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” In <i>{IEEE International Test Conference (ITC’92)}</i>, 120–29. Baltimore, MD, USA: {IEEE}, 1992. <a href=\"https://doi.org/10.1109/test.1992.527812\">https://doi.org/10.1109/test.1992.527812</a>.","bibtex":"@inproceedings{Hellebrand_Tarnick_Rajski_Courtois_1992, place={Baltimore, MD, USA}, title={Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers}, DOI={<a href=\"https://doi.org/10.1109/test.1992.527812\">10.1109/test.1992.527812</a>}, booktitle={{IEEE International Test Conference (ITC’92)}}, publisher={{IEEE}}, author={Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}, year={1992}, pages={120–129} }"},"page":"120-129","publication":"{IEEE International Test Conference (ITC'92)}","doi":"10.1109/test.1992.527812","year":"1992","author":[{"id":"209","first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille"},{"first_name":"Steffen","full_name":"Tarnick, Steffen","last_name":"Tarnick"},{"last_name":"Rajski","full_name":"Rajski, Janusz","first_name":"Janusz"},{"first_name":"Bernard","last_name":"Courtois","full_name":"Courtois, Bernard"}],"publisher":"{IEEE}","user_id":"659","date_created":"2019-08-28T10:27:45Z","extern":"1","type":"conference","status":"public","place":"Baltimore, MD, USA","title":"Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers","_id":"13016","department":[{"_id":"48"}],"date_updated":"2020-05-07T05:16:02Z","language":[{"iso":"eng"}]}]