{"date_updated":"2022-05-11T16:23:33Z","year":"1992","title":"Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers","language":[{"iso":"eng"}],"_id":"13016","citation":{"bibtex":"@inproceedings{Hellebrand_Tarnick_Rajski_Courtois_1992, place={Baltimore, MD, USA}, title={Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers}, DOI={<a href=\"https://doi.org/10.1109/test.1992.527812\">10.1109/test.1992.527812</a>}, booktitle={IEEE International Test Conference (ITC’92)}, publisher={IEEE}, author={Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}, year={1992}, pages={120–129} }","short":"S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, in: IEEE International Test Conference (ITC’92), IEEE, Baltimore, MD, USA, 1992, pp. 120–129.","apa":"Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1992). Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. <i>IEEE International Test Conference (ITC’92)</i>, 120–129. <a href=\"https://doi.org/10.1109/test.1992.527812\">https://doi.org/10.1109/test.1992.527812</a>","ama":"Hellebrand S, Tarnick S, Rajski J, Courtois B. Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. In: <i>IEEE International Test Conference (ITC’92)</i>. IEEE; 1992:120-129. doi:<a href=\"https://doi.org/10.1109/test.1992.527812\">10.1109/test.1992.527812</a>","mla":"Hellebrand, Sybille, et al. “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” <i>IEEE International Test Conference (ITC’92)</i>, IEEE, 1992, pp. 120–29, doi:<a href=\"https://doi.org/10.1109/test.1992.527812\">10.1109/test.1992.527812</a>.","ieee":"S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers,” in <i>IEEE International Test Conference (ITC’92)</i>, 1992, pp. 120–129, doi: <a href=\"https://doi.org/10.1109/test.1992.527812\">10.1109/test.1992.527812</a>.","chicago":"Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois. “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” In <i>IEEE International Test Conference (ITC’92)</i>, 120–29. Baltimore, MD, USA: IEEE, 1992. <a href=\"https://doi.org/10.1109/test.1992.527812\">https://doi.org/10.1109/test.1992.527812</a>."},"author":[{"orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209","last_name":"Hellebrand","first_name":"Sybille"},{"last_name":"Tarnick","first_name":"Steffen","full_name":"Tarnick, Steffen"},{"full_name":"Rajski, Janusz","first_name":"Janusz","last_name":"Rajski"},{"full_name":"Courtois, Bernard","last_name":"Courtois","first_name":"Bernard"}],"place":"Baltimore, MD, USA","extern":"1","page":"120-129","publisher":"IEEE","status":"public","user_id":"209","date_created":"2019-08-28T10:27:45Z","doi":"10.1109/test.1992.527812","department":[{"_id":"48"}],"publication":"IEEE International Test Conference (ITC'92)","type":"conference"}