{"volume":11,"doi":"10.1109/43.108616","citation":{"apa":"Wunderlich, H.-J., &#38; Hellebrand, S. (1992). The Pseudoexhaustive Test of Sequential Circuits. <i>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)</i>, <i>11</i>(1), 26–33. <a href=\"https://doi.org/10.1109/43.108616\">https://doi.org/10.1109/43.108616</a>","ieee":"H.-J. Wunderlich and S. Hellebrand, “The Pseudoexhaustive Test of Sequential Circuits,” <i>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)</i>, vol. 11, no. 1, pp. 26–33, 1992, doi: <a href=\"https://doi.org/10.1109/43.108616\">10.1109/43.108616</a>.","mla":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudoexhaustive Test of Sequential Circuits.” <i>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)</i>, vol. 11, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 1992, pp. 26–33, doi:<a href=\"https://doi.org/10.1109/43.108616\">10.1109/43.108616</a>.","bibtex":"@article{Wunderlich_Hellebrand_1992, title={The Pseudoexhaustive Test of Sequential Circuits}, volume={11}, DOI={<a href=\"https://doi.org/10.1109/43.108616\">10.1109/43.108616</a>}, number={1}, journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1992}, pages={26–33} }","chicago":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudoexhaustive Test of Sequential Circuits.” <i>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)</i> 11, no. 1 (1992): 26–33. <a href=\"https://doi.org/10.1109/43.108616\">https://doi.org/10.1109/43.108616</a>.","ama":"Wunderlich H-J, Hellebrand S. The Pseudoexhaustive Test of Sequential Circuits. <i>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)</i>. 1992;11(1):26-33. doi:<a href=\"https://doi.org/10.1109/43.108616\">10.1109/43.108616</a>","short":"H.-J. Wunderlich, S. Hellebrand, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 11 (1992) 26–33."},"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","user_id":"209","department":[{"_id":"48"}],"publication":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)","issue":"1","date_created":"2019-08-28T10:29:15Z","title":"The Pseudoexhaustive Test of Sequential Circuits","page":"26-33","type":"journal_article","_id":"13017","intvolume":"        11","language":[{"iso":"eng"}],"extern":"1","year":"1992","status":"public","author":[{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"},{"full_name":"Hellebrand, Sybille","last_name":"Hellebrand","first_name":"Sybille","id":"209","orcid":"0000-0002-3717-3939"}],"date_updated":"2022-05-11T16:12:45Z"}