[{"extern":"1","page":"670-679","year":"1990","_id":"13019","date_created":"2019-08-28T10:29:17Z","citation":{"apa":"Hellebrand, S., Wunderlich, H.-J., &#38; F. Haberl, O. (1990). Generating Pseudo-Exhaustive Vectors for External Testing. In <i>{IEEE International Test Conference (ITC’90)}</i> (pp. 670–679). Washington, DC, USA: {IEEE (Comput. Soc. Press)}. <a href=\"https://doi.org/10.1109/test.1990.114082\">https://doi.org/10.1109/test.1990.114082</a>","ieee":"S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, “Generating Pseudo-Exhaustive Vectors for External Testing,” in <i>{IEEE International Test Conference (ITC’90)}</i>, 1990, pp. 670–679.","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. “Generating Pseudo-Exhaustive Vectors for External Testing.” In <i>{IEEE International Test Conference (ITC’90)}</i>, 670–79. Washington, DC, USA: {IEEE (Comput. Soc. Press)}, 1990. <a href=\"https://doi.org/10.1109/test.1990.114082\">https://doi.org/10.1109/test.1990.114082</a>.","bibtex":"@inproceedings{Hellebrand_Wunderlich_F. Haberl_1990, place={Washington, DC, USA}, title={Generating Pseudo-Exhaustive Vectors for External Testing}, DOI={<a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>}, booktitle={{IEEE International Test Conference (ITC’90)}}, publisher={{IEEE (Comput. Soc. Press)}}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver}, year={1990}, pages={670–679} }","mla":"Hellebrand, Sybille, et al. “Generating Pseudo-Exhaustive Vectors for External Testing.” <i>{IEEE International Test Conference (ITC’90)}</i>, {IEEE (Comput. Soc. Press)}, 1990, pp. 670–79, doi:<a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>.","ama":"Hellebrand S, Wunderlich H-J, F. Haberl O. Generating Pseudo-Exhaustive Vectors for External Testing. In: <i>{IEEE International Test Conference (ITC’90)}</i>. Washington, DC, USA: {IEEE (Comput. Soc. Press)}; 1990:670-679. doi:<a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>","short":"S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, in: {IEEE International Test Conference (ITC’90)}, {IEEE (Comput. Soc. Press)}, Washington, DC, USA, 1990, pp. 670–679."},"user_id":"659","type":"conference","publication":"{IEEE International Test Conference (ITC'90)}","status":"public","department":[{"_id":"48"}],"place":"Washington, DC, USA","language":[{"iso":"eng"}],"date_updated":"2020-05-07T05:16:02Z","publisher":"{IEEE (Comput. Soc. Press)}","title":"Generating Pseudo-Exhaustive Vectors for External Testing","author":[{"full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","id":"209","first_name":"Sybille","last_name":"Hellebrand"},{"last_name":"Wunderlich","first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim"},{"full_name":"F. Haberl, Oliver","last_name":"F. Haberl","first_name":"Oliver"}],"doi":"10.1109/test.1990.114082"}]