{"date_created":"2019-08-28T10:29:17Z","user_id":"209","department":[{"_id":"48"}],"doi":"10.1109/test.1990.114082","publication":"IEEE International Test Conference (ITC'90)","status":"public","type":"conference","publisher":"IEEE","_id":"13019","citation":{"chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. “Generating Pseudo-Exhaustive Vectors for External Testing.” In <i>IEEE International Test Conference (ITC’90)</i>, 670–79. Washington, DC, USA: IEEE, 1990. <a href=\"https://doi.org/10.1109/test.1990.114082\">https://doi.org/10.1109/test.1990.114082</a>.","bibtex":"@inproceedings{Hellebrand_Wunderlich_F. Haberl_1990, place={Washington, DC, USA}, title={Generating Pseudo-Exhaustive Vectors for External Testing}, DOI={<a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>}, booktitle={IEEE International Test Conference (ITC’90)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver}, year={1990}, pages={670–679} }","apa":"Hellebrand, S., Wunderlich, H.-J., &#38; F. Haberl, O. (1990). Generating Pseudo-Exhaustive Vectors for External Testing. <i>IEEE International Test Conference (ITC’90)</i>, 670–679. <a href=\"https://doi.org/10.1109/test.1990.114082\">https://doi.org/10.1109/test.1990.114082</a>","ama":"Hellebrand S, Wunderlich H-J, F. Haberl O. Generating Pseudo-Exhaustive Vectors for External Testing. In: <i>IEEE International Test Conference (ITC’90)</i>. IEEE; 1990:670-679. doi:<a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>","short":"S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, in: IEEE International Test Conference (ITC’90), IEEE, Washington, DC, USA, 1990, pp. 670–679.","ieee":"S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, “Generating Pseudo-Exhaustive Vectors for External Testing,” in <i>IEEE International Test Conference (ITC’90)</i>, 1990, pp. 670–679, doi: <a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>.","mla":"Hellebrand, Sybille, et al. “Generating Pseudo-Exhaustive Vectors for External Testing.” <i>IEEE International Test Conference (ITC’90)</i>, IEEE, 1990, pp. 670–79, doi:<a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>."},"extern":"1","place":"Washington, DC, USA","page":"670-679","author":[{"orcid":"0000-0002-3717-3939","id":"209","full_name":"Hellebrand, Sybille","first_name":"Sybille","last_name":"Hellebrand"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"},{"last_name":"F. Haberl","first_name":"Oliver","full_name":"F. Haberl, Oliver"}],"date_updated":"2022-05-11T16:59:33Z","year":"1990","title":"Generating Pseudo-Exhaustive Vectors for External Testing","language":[{"iso":"eng"}]}