{"status":"public","date_created":"2019-08-28T10:29:17Z","publisher":"IEEE","author":[{"id":"209","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","first_name":"Sybille"},{"last_name":"Wunderlich","first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim"},{"last_name":"F. Haberl","full_name":"F. Haberl, Oliver","first_name":"Oliver"}],"publication":"IEEE International Test Conference (ITC'90)","department":[{"_id":"48"}],"user_id":"209","title":"Generating Pseudo-Exhaustive Vectors for External Testing","place":"Washington, DC, USA","extern":"1","language":[{"iso":"eng"}],"citation":{"short":"S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, in: IEEE International Test Conference (ITC’90), IEEE, Washington, DC, USA, 1990, pp. 670–679.","ieee":"S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, “Generating Pseudo-Exhaustive Vectors for External Testing,” in IEEE International Test Conference (ITC’90), 1990, pp. 670–679, doi: 10.1109/test.1990.114082.","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. “Generating Pseudo-Exhaustive Vectors for External Testing.” In IEEE International Test Conference (ITC’90), 670–79. Washington, DC, USA: IEEE, 1990. https://doi.org/10.1109/test.1990.114082.","apa":"Hellebrand, S., Wunderlich, H.-J., & F. Haberl, O. (1990). Generating Pseudo-Exhaustive Vectors for External Testing. IEEE International Test Conference (ITC’90), 670–679. https://doi.org/10.1109/test.1990.114082","ama":"Hellebrand S, Wunderlich H-J, F. Haberl O. Generating Pseudo-Exhaustive Vectors for External Testing. In: IEEE International Test Conference (ITC’90). IEEE; 1990:670-679. doi:10.1109/test.1990.114082","mla":"Hellebrand, Sybille, et al. “Generating Pseudo-Exhaustive Vectors for External Testing.” IEEE International Test Conference (ITC’90), IEEE, 1990, pp. 670–79, doi:10.1109/test.1990.114082.","bibtex":"@inproceedings{Hellebrand_Wunderlich_F. Haberl_1990, place={Washington, DC, USA}, title={Generating Pseudo-Exhaustive Vectors for External Testing}, DOI={10.1109/test.1990.114082}, booktitle={IEEE International Test Conference (ITC’90)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver}, year={1990}, pages={670–679} }"},"type":"conference","year":"1990","page":"670-679","doi":"10.1109/test.1990.114082","_id":"13019","date_updated":"2022-05-11T16:59:33Z"}