{"user_id":"209","publication":"18th International Symposium on Fault-Tolerant Computing, FTCS-18","place":"Tokyo, Japan","date_created":"2019-08-28T10:30:18Z","author":[{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"},{"orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","id":"209","first_name":"Sybille"}],"department":[{"_id":"48"}],"title":"Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits","type":"conference","_id":"13021","doi":"10.1109/ftcs.1988.5294","status":"public","language":[{"iso":"eng"}],"citation":{"mla":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits.” <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>, 1988, pp. 36–45, doi:<a href=\"https://doi.org/10.1109/ftcs.1988.5294\">10.1109/ftcs.1988.5294</a>.","chicago":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits.” In <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>, 36–45. Tokyo, Japan, 1988. <a href=\"https://doi.org/10.1109/ftcs.1988.5294\">https://doi.org/10.1109/ftcs.1988.5294</a>.","ieee":"H.-J. Wunderlich and S. Hellebrand, “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits,” in <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>, 1988, pp. 36–45, doi: <a href=\"https://doi.org/10.1109/ftcs.1988.5294\">10.1109/ftcs.1988.5294</a>.","bibtex":"@inproceedings{Wunderlich_Hellebrand_1988, place={Tokyo, Japan}, title={Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits}, DOI={<a href=\"https://doi.org/10.1109/ftcs.1988.5294\">10.1109/ftcs.1988.5294</a>}, booktitle={18th International Symposium on Fault-Tolerant Computing, FTCS-18}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1988}, pages={36–45} }","ama":"Wunderlich H-J, Hellebrand S. Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits. In: <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>. ; 1988:36-45. doi:<a href=\"https://doi.org/10.1109/ftcs.1988.5294\">10.1109/ftcs.1988.5294</a>","apa":"Wunderlich, H.-J., &#38; Hellebrand, S. (1988). Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits. <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>, 36–45. <a href=\"https://doi.org/10.1109/ftcs.1988.5294\">https://doi.org/10.1109/ftcs.1988.5294</a>","short":"H.-J. Wunderlich, S. Hellebrand, in: 18th International Symposium on Fault-Tolerant Computing, FTCS-18, Tokyo, Japan, 1988, pp. 36–45."},"year":"1988","page":"36-45","extern":"1","date_updated":"2022-05-11T17:01:49Z"}