---
_id: '13025'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Arne
full_name: Juergensen, Arne
last_name: Juergensen
- first_name: Albrecht
full_name: Stroele, Albrecht
last_name: Stroele
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Hellebrand S, Juergensen A, Stroele A, Wunderlich H-J. Chip Level Test Planning
for Controlling the Tradeoff between Hardware Overhead and Test Time. University
of Siegen, Germany; 1994.
apa: Hellebrand, S., Juergensen, A., Stroele, A., & Wunderlich, H.-J. (1994).
Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead
and Test Time. University of Siegen, Germany.
bibtex: '@book{Hellebrand_Juergensen_Stroele_Wunderlich_1994, place={University
of Siegen, Germany}, title={Chip Level Test Planning for Controlling the Tradeoff
between Hardware Overhead and Test Time}, author={Hellebrand, Sybille and Juergensen,
Arne and Stroele, Albrecht and Wunderlich, Hans-Joachim}, year={1994} }'
chicago: Hellebrand, Sybille, Arne Juergensen, Albrecht Stroele, and Hans-Joachim
Wunderlich. Chip Level Test Planning for Controlling the Tradeoff between Hardware
Overhead and Test Time. University of Siegen, Germany, 1994.
ieee: S. Hellebrand, A. Juergensen, A. Stroele, and H.-J. Wunderlich, Chip Level
Test Planning for Controlling the Tradeoff between Hardware Overhead and Test
Time. University of Siegen, Germany, 1994.
mla: Hellebrand, Sybille, et al. Chip Level Test Planning for Controlling the
Tradeoff between Hardware Overhead and Test Time. 1994.
short: S. Hellebrand, A. Juergensen, A. Stroele, H.-J. Wunderlich, Chip Level Test
Planning for Controlling the Tradeoff between Hardware Overhead and Test Time,
University of Siegen, Germany, 1994.
date_created: 2019-08-28T10:31:17Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
extern: '1'
language:
- iso: eng
place: University of Siegen, Germany
status: public
title: Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead
and Test Time
type: report
user_id: '659'
year: '1994'
...