--- _id: '13025' author: - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Arne full_name: Juergensen, Arne last_name: Juergensen - first_name: Albrecht full_name: Stroele, Albrecht last_name: Stroele - first_name: Hans-Joachim full_name: Wunderlich, Hans-Joachim last_name: Wunderlich citation: ama: Hellebrand S, Juergensen A, Stroele A, Wunderlich H-J. Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time. University of Siegen, Germany; 1994. apa: Hellebrand, S., Juergensen, A., Stroele, A., & Wunderlich, H.-J. (1994). Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time. University of Siegen, Germany. bibtex: '@book{Hellebrand_Juergensen_Stroele_Wunderlich_1994, place={University of Siegen, Germany}, title={Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time}, author={Hellebrand, Sybille and Juergensen, Arne and Stroele, Albrecht and Wunderlich, Hans-Joachim}, year={1994} }' chicago: Hellebrand, Sybille, Arne Juergensen, Albrecht Stroele, and Hans-Joachim Wunderlich. Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time. University of Siegen, Germany, 1994. ieee: S. Hellebrand, A. Juergensen, A. Stroele, and H.-J. Wunderlich, Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time. University of Siegen, Germany, 1994. mla: Hellebrand, Sybille, et al. Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time. 1994. short: S. Hellebrand, A. Juergensen, A. Stroele, H.-J. Wunderlich, Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time, University of Siegen, Germany, 1994. date_created: 2019-08-28T10:31:17Z date_updated: 2022-01-06T06:51:27Z department: - _id: '48' extern: '1' language: - iso: eng place: University of Siegen, Germany status: public title: Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time type: report user_id: '659' year: '1994' ...