{"author":[{"id":"209","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","first_name":"Sybille"},{"first_name":"Maik","last_name":"Herzog","full_name":"Herzog, Maik"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"extern":"1","year":"1995","place":"University of Siegen, Germany","status":"public","date_created":"2019-08-28T10:32:26Z","user_id":"659","citation":{"apa":"Hellebrand, S., Herzog, M., &#38; Wunderlich, H.-J. (1995). <i>Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing</i>. University of Siegen, Germany.","short":"S. Hellebrand, M. Herzog, H.-J. Wunderlich, Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing, University of Siegen, Germany, 1995.","chicago":"Hellebrand, Sybille, Maik Herzog, and Hans-Joachim Wunderlich. <i>Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing</i>. University of Siegen, Germany, 1995.","ieee":"S. Hellebrand, M. Herzog, and H.-J. Wunderlich, <i>Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing</i>. University of Siegen, Germany, 1995.","bibtex":"@book{Hellebrand_Herzog_Wunderlich_1995, place={University of Siegen, Germany}, title={Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing}, author={Hellebrand, Sybille and Herzog, Maik and Wunderlich, Hans-Joachim}, year={1995} }","ama":"Hellebrand S, Herzog M, Wunderlich H-J. <i>Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing</i>. University of Siegen, Germany; 1995.","mla":"Hellebrand, Sybille, et al. <i>Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing</i>. 1995."},"title":"Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing","_id":"13028","department":[{"_id":"48"}],"language":[{"iso":"eng"}],"type":"report","date_updated":"2022-01-06T06:51:27Z"}