[{"dc":{"rights":["info:eu-repo/semantics/closedAccess"],"language":["eng"],"type":["info:eu-repo/semantics/conferenceObject","doc-type:conferenceObject","text","http://purl.org/coar/resource_type/c_5794"],"identifier":["https://ris.uni-paderborn.de/record/13037"],"date":["2007"],"title":["Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance"],"creator":["Hellebrand, Sybille","G. Zoellin, Christian","Wunderlich, Hans-Joachim","Ludwig, Stefan","Coym, Torsten","Straube, Bernd"],"source":["Hellebrand S, G. Zoellin C, Wunderlich H-J, Ludwig S, Coym T, Straube B. Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance. In: 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper). ; 2007."]},"user_id":"209","place":"Bled, Slovenia","status":"public","date_created":"2019-08-28T10:40:00Z","dini_type":"doc-type:conferenceObject","author":[{"orcid":"0000-0002-3717-3939","first_name":"Sybille","id":"209","last_name":"Hellebrand"},{"last_name":"G. Zoellin","first_name":"Christian"},{"last_name":"Wunderlich","first_name":"Hans-Joachim"},{"last_name":"Ludwig","first_name":"Stefan"},{"first_name":"Torsten","last_name":"Coym"},{"last_name":"Straube","first_name":"Bernd"}],"department":[{"tree":[{"_id":"3"},{"_id":"34"},{"_id":"44"},{"_id":"43"}],"_id":"48"}],"publication":"43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM'07), (Invited Paper)","creator":{"login":"ibers","id":"659"},"date_updated":"2022-05-11T16:35:35Z","_id":"13037","language":[{}],"citation":{"short":"S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, B. Straube, in: 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper), Bled, Slovenia, 2007.","ieee":"S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, and B. Straube, “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance,” 2007.","chicago":"Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” In 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper). Bled, Slovenia, 2007.","apa":"Hellebrand, S., G. Zoellin, C., Wunderlich, H.-J., Ludwig, S., Coym, T., & Straube, B. (2007). Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance. 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper).","bibtex":"@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Bled, Slovenia}, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, booktitle={43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007} }","mla":"Hellebrand, Sybille, et al. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper), 2007."},"type":"conference","uri_base":"https://ris.uni-paderborn.de","message":"Invited Paper"}]