{"user_id":"209","author":[{"full_name":"Hellebrand, Sybille","first_name":"Sybille","id":"209","last_name":"Hellebrand","orcid":"0000-0002-3717-3939"},{"full_name":"G. Zoellin, Christian","first_name":"Christian","last_name":"G. Zoellin"},{"full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim","last_name":"Wunderlich"},{"full_name":"Ludwig, Stefan","first_name":"Stefan","last_name":"Ludwig"},{"last_name":"Coym","full_name":"Coym, Torsten","first_name":"Torsten"},{"last_name":"Straube","first_name":"Bernd","full_name":"Straube, Bernd"}],"place":"Bled, Slovenia","date_created":"2019-08-28T10:40:00Z","department":[{"_id":"48"}],"publication":"43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM'07), (Invited Paper)","_id":"13037","status":"public","type":"conference","title":"Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance","year":"2007","citation":{"short":"S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, B. Straube, in: 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper), Bled, Slovenia, 2007.","ama":"Hellebrand S, G. Zoellin C, Wunderlich H-J, Ludwig S, Coym T, Straube B. Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance. In: <i>43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper)</i>. ; 2007.","mla":"Hellebrand, Sybille, et al. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” <i>43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper)</i>, 2007.","apa":"Hellebrand, S., G. Zoellin, C., Wunderlich, H.-J., Ludwig, S., Coym, T., &#38; Straube, B. (2007). Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance. <i>43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper)</i>.","bibtex":"@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Bled, Slovenia}, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, booktitle={43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007} }","ieee":"S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, and B. Straube, “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance,” 2007.","chicago":"Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” In <i>43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper)</i>. Bled, Slovenia, 2007."},"date_updated":"2022-05-11T16:35:35Z","language":[{"iso":"eng"}]}