{"citation":{"ama":"Hellebrand S. <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk); 2007.","ieee":"S. Hellebrand, <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk), 2007.","chicago":"Hellebrand, Sybille. <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk), 2007.","short":"S. Hellebrand, Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing, 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk), 2007.","bibtex":"@book{Hellebrand_2007, place={5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk)}, title={Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing}, author={Hellebrand, Sybille}, year={2007} }","mla":"Hellebrand, Sybille. <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 2007.","apa":"Hellebrand, S. (2007). <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk)."},"year":"2007","place":"5th IEEE East-West Design \\& Test Symposium, Yerevan, Armenia (Invited Talk)","title":"Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing","author":[{"full_name":"Hellebrand, Sybille","id":"209","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","first_name":"Sybille"}],"date_created":"2019-08-28T10:40:47Z","date_updated":"2022-01-06T06:51:27Z","status":"public","type":"misc","language":[{"iso":"eng"}],"keyword":["WORKSHOP"],"user_id":"659","department":[{"_id":"48"}],"_id":"13038"}