{"author":[{"last_name":"Hellebrand","id":"209","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","first_name":"Sybille"}],"user_id":"659","type":"misc","_id":"13038","status":"public","keyword":["WORKSHOP"],"date_created":"2019-08-28T10:40:47Z","citation":{"short":"S. Hellebrand, Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing, 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk), 2007.","bibtex":"@book{Hellebrand_2007, place={5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk)}, title={Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing}, author={Hellebrand, Sybille}, year={2007} }","chicago":"Hellebrand, Sybille. <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk), 2007.","mla":"Hellebrand, Sybille. <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 2007.","ieee":"S. Hellebrand, <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk), 2007.","apa":"Hellebrand, S. (2007). <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk).","ama":"Hellebrand S. <i>Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing</i>. 5th IEEE East-West Design \\&#38; Test Symposium, Yerevan, Armenia (Invited Talk); 2007."},"place":"5th IEEE East-West Design \\& Test Symposium, Yerevan, Armenia (Invited Talk)","date_updated":"2022-01-06T06:51:27Z","title":"Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing","department":[{"_id":"48"}],"language":[{"iso":"eng"}],"year":"2007"}