{"_id":"13042","title":"An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy","keyword":["WORKSHOP"],"department":[{"_id":"48"}],"date_created":"2019-08-28T10:43:12Z","user_id":"659","citation":{"chicago":"Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, 2007.","short":"P. Oehler, S. Hellebrand, H.-J. Wunderlich, An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy, 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, 2007.","apa":"Oehler, P., Hellebrand, S., &#38; Wunderlich, H.-J. (2007). <i>An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany.","bibtex":"@book{Oehler_Hellebrand_Wunderlich_2007, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany}, title={An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007} }","mla":"Oehler, Philipp, et al. <i>An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy</i>. 2007.","ama":"Oehler P, Hellebrand S, Wunderlich H-J. <i>An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany; 2007.","ieee":"P. Oehler, S. Hellebrand, and H.-J. Wunderlich, <i>An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, 2007."},"year":"2007","place":"17th GI/ITG/GMM Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\", Erlangen, Germany","status":"public","author":[{"full_name":"Oehler, Philipp","last_name":"Oehler","first_name":"Philipp"},{"full_name":"Hellebrand, Sybille","last_name":"Hellebrand","id":"209","first_name":"Sybille","orcid":"0000-0002-3717-3939"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"date_updated":"2022-01-06T06:51:27Z","type":"misc","language":[{"iso":"eng"}]}