{"date_updated":"2022-05-11T16:38:35Z","page":"305-311","issue":"5","language":[{"iso":"eng"}],"intvolume":"        48","publication":"it - Information Technology","title":"DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme","user_id":"209","year":"2006","author":[{"full_name":"Becker, Bernd","last_name":"Becker","first_name":"Bernd"},{"first_name":"Ilia","full_name":"Polian, Ilia","last_name":"Polian"},{"orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","id":"209","first_name":"Sybille"},{"last_name":"Straube","full_name":"Straube, Bernd","first_name":"Bernd"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}],"status":"public","_id":"13045","date_created":"2019-08-28T10:44:53Z","department":[{"_id":"48"}],"citation":{"mla":"Becker, Bernd, et al. “DFG-Projekt RealTest - Test Und Zuverlässigkeit Nanoelektronischer Systeme.” <i>It - Information Technology</i>, vol. 48, no. 5, 2006, pp. 305–11.","chicago":"Becker, Bernd, Ilia Polian, Sybille Hellebrand, Bernd Straube, and Hans-Joachim Wunderlich. “DFG-Projekt RealTest - Test Und Zuverlässigkeit Nanoelektronischer Systeme.” <i>It - Information Technology</i> 48, no. 5 (2006): 305–11.","apa":"Becker, B., Polian, I., Hellebrand, S., Straube, B., &#38; Wunderlich, H.-J. (2006). DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme. <i>It - Information Technology</i>, <i>48</i>(5), 305–311.","short":"B. Becker, I. Polian, S. Hellebrand, B. Straube, H.-J. Wunderlich, It - Information Technology 48 (2006) 305–311.","ama":"Becker B, Polian I, Hellebrand S, Straube B, Wunderlich H-J. DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme. <i>it - Information Technology</i>. 2006;48(5):305-311.","bibtex":"@article{Becker_Polian_Hellebrand_Straube_Wunderlich_2006, title={DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme}, volume={48}, number={5}, journal={it - Information Technology}, author={Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}, year={2006}, pages={305–311} }","ieee":"B. Becker, I. Polian, S. Hellebrand, B. Straube, and H.-J. Wunderlich, “DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme,” <i>it - Information Technology</i>, vol. 48, no. 5, pp. 305–311, 2006."},"type":"journal_article","volume":48}