---
res:
  bibo_abstract:
  - Marginal hardware introduces severe reliability threats throughout the life cycle
    of a system. Although marginalities may not affect the functionality of a circuit
    immediately after manufacturing, they can degrade into hard failures and must
    be screened out during manufacturing test to prevent early life failures. Furthermore,
    their evolution in the field must be proactively monitored by periodic tests before
    actual failures occur. In recent years small delay faults have gained increasing
    attention as possible indicators of marginal hardware. However, small delay faults
    on short paths may be undetectable even with advanced timing aware ATPG. Faster-than-at-speed
    test (FAST) can detect such hidden delay faults, but so far FAST has mainly been
    restricted to manufacturing test.@eng
  bibo_authorlist:
  - foaf_Person:
      foaf_givenName: Matthias
      foaf_name: Kampmann, Matthias
      foaf_surname: Kampmann
      foaf_workInfoHomepage: http://www.librecat.org/personId=10935
  - foaf_Person:
      foaf_givenName: Michael
      foaf_name: A. Kochte, Michael
      foaf_surname: A. Kochte
  - foaf_Person:
      foaf_givenName: Chang
      foaf_name: Liu, Chang
      foaf_surname: Liu
  - foaf_Person:
      foaf_givenName: Eric
      foaf_name: Schneider, Eric
      foaf_surname: Schneider
  - foaf_Person:
      foaf_givenName: Sybille
      foaf_name: Hellebrand, Sybille
      foaf_surname: Hellebrand
      foaf_workInfoHomepage: http://www.librecat.org/personId=209
    orcid: 0000-0002-3717-3939
  - foaf_Person:
      foaf_givenName: Hans-Joachim
      foaf_name: Wunderlich, Hans-Joachim
      foaf_surname: Wunderlich
  bibo_issue: '10'
  bibo_volume: 38
  dct_date: 2019^xs_gYear
  dct_isPartOf:
  - http://id.crossref.org/issn/1937-4151
  dct_language: eng
  dct_publisher: IEEE@
  dct_title: Built-in Test for Hidden Delay Faults@
...