{"language":[{"iso":"eng"}],"title":"Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits","year":"2010","date_updated":"2022-05-11T16:26:18Z","place":"Chicago, IL, USA","author":[{"full_name":"Becker, Bernd","last_name":"Becker","first_name":"Bernd"},{"orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand","id":"209","full_name":"Hellebrand, Sybille"},{"full_name":"Polian, Ilia","first_name":"Ilia","last_name":"Polian"},{"last_name":"Straube","first_name":"Bernd","full_name":"Straube, Bernd"},{"first_name":"Wolfgang","last_name":"Vermeiren","full_name":"Vermeiren, Wolfgang"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}],"citation":{"chicago":"Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In <i>4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)</i>. Chicago, IL, USA, 2010.","mla":"Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” <i>4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)</i>, 2010.","ieee":"B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, and H.-J. Wunderlich, “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits,” 2010.","apa":"Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., &#38; Wunderlich, H.-J. (2010). Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. <i>4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)</i>.","short":"B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), Chicago, IL, USA, 2010.","ama":"Becker B, Hellebrand S, Polian I, Straube B, Vermeiren W, Wunderlich H-J. Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In: <i>4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)</i>. ; 2010.","bibtex":"@inproceedings{Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Chicago, IL, USA}, title={Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}, booktitle={4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}, author={Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010} }"},"_id":"13049","type":"conference","department":[{"_id":"48"}],"publication":"4th Workshop on Dependable and Secure Nanocomputing (WDSN'10), (Invited Paper)","date_created":"2019-08-28T11:45:36Z","user_id":"209","status":"public"}