[{"date_created":"2019-08-28T11:45:36Z","type":"conference","status":"public","place":"Chicago, IL, USA","title":"Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits","_id":"13049","department":[{"_id":"48"}],"date_updated":"2020-05-07T05:16:05Z","language":[{"iso":"eng"}],"citation":{"mla":"Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” <i>{4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}</i>, 2010.","apa":"Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., &#38; Wunderlich, H.-J. (2010). Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In <i>{4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}</i>. Chicago, IL, USA.","ieee":"B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, and H.-J. Wunderlich, “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits,” in <i>{4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}</i>, 2010.","short":"B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: {4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}, Chicago, IL, USA, 2010.","bibtex":"@inproceedings{Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Chicago, IL, USA}, title={Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}, booktitle={{4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}}, author={Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010} }","ama":"Becker B, Hellebrand S, Polian I, Straube B, Vermeiren W, Wunderlich H-J. Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In: <i>{4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}</i>. Chicago, IL, USA; 2010.","chicago":"Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In <i>{4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}</i>. Chicago, IL, USA, 2010."},"publication":"{4th Workshop on Dependable and Secure Nanocomputing (WDSN'10), (Invited Paper)}","year":"2010","author":[{"first_name":"Bernd","last_name":"Becker","full_name":"Becker, Bernd"},{"last_name":"Hellebrand","full_name":"Hellebrand, Sybille","id":"209","first_name":"Sybille","orcid":"0000-0002-3717-3939"},{"first_name":"Ilia","last_name":"Polian","full_name":"Polian, Ilia"},{"first_name":"Bernd","full_name":"Straube, Bernd","last_name":"Straube"},{"last_name":"Vermeiren","full_name":"Vermeiren, Wolfgang","first_name":"Wolfgang"},{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"}],"user_id":"659"}]