{"volume":56,"issue":"4","title":"SAT-Based ATPG beyond Stuck-at Fault Testing","author":[{"id":"209","first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}],"citation":{"ama":"Hellebrand S, Wunderlich H-J. SAT-Based ATPG beyond Stuck-at Fault Testing. <i>DeGruyter Journal on Information Technology (it)</i>. 2014;56(4):165-172.","mla":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at Fault Testing.” <i>DeGruyter Journal on Information Technology (It)</i>, vol. 56, no. 4, DeGruyter, 2014, pp. 165–72.","ieee":"S. Hellebrand and H.-J. Wunderlich, “SAT-Based ATPG beyond Stuck-at Fault Testing,” <i>DeGruyter Journal on Information Technology (it)</i>, vol. 56, no. 4, pp. 165–172, 2014.","apa":"Hellebrand, S., &#38; Wunderlich, H.-J. (2014). SAT-Based ATPG beyond Stuck-at Fault Testing. <i>DeGruyter Journal on Information Technology (It)</i>, <i>56</i>(4), 165–172.","short":"S. Hellebrand, H.-J. Wunderlich, DeGruyter Journal on Information Technology (It) 56 (2014) 165–172.","bibtex":"@article{Hellebrand_Wunderlich_2014, title={SAT-Based ATPG beyond Stuck-at Fault Testing}, volume={56}, number={4}, journal={DeGruyter Journal on Information Technology (it)}, publisher={DeGruyter}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2014}, pages={165–172} }","chicago":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at Fault Testing.” <i>DeGruyter Journal on Information Technology (It)</i> 56, no. 4 (2014): 165–72."},"date_updated":"2022-01-06T06:51:27Z","type":"journal_article","language":[{"iso":"eng"}],"publisher":"DeGruyter","department":[{"_id":"48"}],"user_id":"209","page":"165-172","year":"2014","publication":"DeGruyter Journal on Information Technology (it)","intvolume":"        56","_id":"13054","date_created":"2019-08-28T11:48:13Z","status":"public"}