{"publication":"Microelectronics Reliability","date_updated":"2022-01-06T06:51:27Z","type":"journal_article","page":"124-133","language":[{"iso":"eng"}],"volume":80,"department":[{"_id":"48"}],"title":"Design For Small Delay Test - A Simulation Study","_id":"13057","date_created":"2019-08-28T11:49:25Z","citation":{"bibtex":"@article{Kampmann_Hellebrand_2018, title={Design For Small Delay Test - A Simulation Study}, volume={80}, journal={Microelectronics Reliability}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2018}, pages={124–133} }","chicago":"Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” <i>Microelectronics Reliability</i> 80 (2018): 124–33.","short":"M. Kampmann, S. Hellebrand, Microelectronics Reliability 80 (2018) 124–133.","mla":"Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” <i>Microelectronics Reliability</i>, vol. 80, 2018, pp. 124–33.","ama":"Kampmann M, Hellebrand S. Design For Small Delay Test - A Simulation Study. <i>Microelectronics Reliability</i>. 2018;80:124-133.","ieee":"M. Kampmann and S. Hellebrand, “Design For Small Delay Test - A Simulation Study,” <i>Microelectronics Reliability</i>, vol. 80, pp. 124–133, 2018.","apa":"Kampmann, M., &#38; Hellebrand, S. (2018). Design For Small Delay Test - A Simulation Study. <i>Microelectronics Reliability</i>, <i>80</i>, 124–133."},"user_id":"659","year":"2018","intvolume":"        80","status":"public","author":[{"last_name":"Kampmann","id":"10935","full_name":"Kampmann, Matthias","first_name":"Matthias"},{"orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand","id":"209","full_name":"Hellebrand, Sybille"}]}