--- _id: '13057' author: - first_name: Matthias full_name: Kampmann, Matthias id: '10935' last_name: Kampmann - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 citation: ama: Kampmann M, Hellebrand S. Design For Small Delay Test - A Simulation Study. Microelectronics Reliability. 2018;80:124-133. apa: Kampmann, M., & Hellebrand, S. (2018). Design For Small Delay Test - A Simulation Study. Microelectronics Reliability, 80, 124–133. bibtex: '@article{Kampmann_Hellebrand_2018, title={Design For Small Delay Test - A Simulation Study}, volume={80}, journal={Microelectronics Reliability}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2018}, pages={124–133} }' chicago: 'Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” Microelectronics Reliability 80 (2018): 124–33.' ieee: M. Kampmann and S. Hellebrand, “Design For Small Delay Test - A Simulation Study,” Microelectronics Reliability, vol. 80, pp. 124–133, 2018. mla: Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” Microelectronics Reliability, vol. 80, 2018, pp. 124–33. short: M. Kampmann, S. Hellebrand, Microelectronics Reliability 80 (2018) 124–133. date_created: 2019-08-28T11:49:25Z date_updated: 2022-01-06T06:51:27Z department: - _id: '48' intvolume: ' 80' language: - iso: eng page: 124-133 publication: Microelectronics Reliability status: public title: Design For Small Delay Test - A Simulation Study type: journal_article user_id: '659' volume: 80 year: '2018' ...