---
_id: '13057'
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: Kampmann M, Hellebrand S. Design For Small Delay Test - A Simulation Study.
Microelectronics Reliability. 2018;80:124-133.
apa: Kampmann, M., & Hellebrand, S. (2018). Design For Small Delay Test - A
Simulation Study. Microelectronics Reliability, 80, 124–133.
bibtex: '@article{Kampmann_Hellebrand_2018, title={Design For Small Delay Test -
A Simulation Study}, volume={80}, journal={Microelectronics Reliability}, author={Kampmann,
Matthias and Hellebrand, Sybille}, year={2018}, pages={124–133} }'
chicago: 'Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test
- A Simulation Study.” Microelectronics Reliability 80 (2018): 124–33.'
ieee: M. Kampmann and S. Hellebrand, “Design For Small Delay Test - A Simulation
Study,” Microelectronics Reliability, vol. 80, pp. 124–133, 2018.
mla: Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test -
A Simulation Study.” Microelectronics Reliability, vol. 80, 2018, pp. 124–33.
short: M. Kampmann, S. Hellebrand, Microelectronics Reliability 80 (2018) 124–133.
date_created: 2019-08-28T11:49:25Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
intvolume: ' 80'
language:
- iso: eng
page: 124-133
publication: Microelectronics Reliability
status: public
title: Design For Small Delay Test - A Simulation Study
type: journal_article
user_id: '659'
volume: 80
year: '2018'
...