{"language":[{"iso":"eng"}],"issue":"1/2","date_updated":"2022-04-01T15:51:56Z","type":"journal_article","publication":"Journal of Electronic Testing Theory and Applications - JETTA","page":"127-138","year":"1998","status":"public","intvolume":" 12","author":[{"first_name":"Sybille","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209","last_name":"Hellebrand"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"},{"last_name":"Hertwig","full_name":"Hertwig, Andre","first_name":"Andre"}],"extern":"1","volume":12,"title":"Mixed-Mode BIST Using Embedded Processors","_id":"13061","department":[{"_id":"48"}],"date_created":"2019-08-28T11:54:27Z","user_id":"209","citation":{"bibtex":"@article{Hellebrand_Wunderlich_Hertwig_1998, title={Mixed-Mode BIST Using Embedded Processors}, volume={12}, number={1/2}, journal={Journal of Electronic Testing Theory and Applications - JETTA}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}, year={1998}, pages={127–138} }","mla":"Hellebrand, Sybille, et al. “Mixed-Mode BIST Using Embedded Processors.” Journal of Electronic Testing Theory and Applications - JETTA, vol. 12, no. 1/2, 1998, pp. 127–38.","ama":"Hellebrand S, Wunderlich H-J, Hertwig A. Mixed-Mode BIST Using Embedded Processors. Journal of Electronic Testing Theory and Applications - JETTA. 1998;12(1/2):127-138.","ieee":"S. Hellebrand, H.-J. Wunderlich, and A. Hertwig, “Mixed-Mode BIST Using Embedded Processors,” Journal of Electronic Testing Theory and Applications - JETTA, vol. 12, no. 1/2, pp. 127–138, 1998.","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Andre Hertwig. “Mixed-Mode BIST Using Embedded Processors.” Journal of Electronic Testing Theory and Applications - JETTA 12, no. 1/2 (1998): 127–38.","short":"S. Hellebrand, H.-J. Wunderlich, A. Hertwig, Journal of Electronic Testing Theory and Applications - JETTA 12 (1998) 127–138.","apa":"Hellebrand, S., Wunderlich, H.-J., & Hertwig, A. (1998). Mixed-Mode BIST Using Embedded Processors. Journal of Electronic Testing Theory and Applications - JETTA, 12(1/2), 127–138."}}