{"user_id":"209","place":"Szczyrk, Poland","publication":"Design & Diagnostics of Electronic Circuits & Systems (DDECS'98)","date_created":"2019-08-28T11:55:07Z","author":[{"last_name":"N. Yarmolik","full_name":"N. Yarmolik, Vyacheslav","first_name":"Vyacheslav"},{"first_name":"Yuri","full_name":"V. Klimets, Yuri","last_name":"V. Klimets"},{"full_name":"Hellebrand, Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","id":"209","first_name":"Sybille"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"title":"New Transparent RAM BIST Based on Self-Adjusting Output Data Compression","department":[{"_id":"48"}],"type":"conference","_id":"13063","status":"public","language":[{"iso":"eng"}],"citation":{"short":"V. N. Yarmolik, Y. V. Klimets, S. Hellebrand, H.-J. Wunderlich, in: Design & Diagnostics of Electronic Circuits & Systems (DDECS’98), Szczyrk, Poland, 1998, pp. 27–33.","apa":"N. Yarmolik, V., V. Klimets, Y., Hellebrand, S., & Wunderlich, H.-J. (1998). New Transparent RAM BIST Based on Self-Adjusting Output Data Compression. Design & Diagnostics of Electronic Circuits & Systems (DDECS’98), 27–33.","ama":"N. Yarmolik V, V. Klimets Y, Hellebrand S, Wunderlich H-J. New Transparent RAM BIST Based on Self-Adjusting Output Data Compression. In: Design & Diagnostics of Electronic Circuits & Systems (DDECS’98). ; 1998:27-33.","chicago":"N. Yarmolik, Vyacheslav, Yuri V. Klimets, Sybille Hellebrand, and Hans-Joachim Wunderlich. “New Transparent RAM BIST Based on Self-Adjusting Output Data Compression.” In Design & Diagnostics of Electronic Circuits & Systems (DDECS’98), 27–33. Szczyrk, Poland, 1998.","mla":"N. Yarmolik, Vyacheslav, et al. “New Transparent RAM BIST Based on Self-Adjusting Output Data Compression.” Design & Diagnostics of Electronic Circuits & Systems (DDECS’98), 1998, pp. 27–33.","bibtex":"@inproceedings{N. Yarmolik_V. Klimets_Hellebrand_Wunderlich_1998, place={Szczyrk, Poland}, title={New Transparent RAM BIST Based on Self-Adjusting Output Data Compression}, booktitle={Design & Diagnostics of Electronic Circuits & Systems (DDECS’98)}, author={N. Yarmolik, Vyacheslav and V. Klimets, Yuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998}, pages={27–33} }","ieee":"V. N. Yarmolik, Y. V. Klimets, S. Hellebrand, and H.-J. Wunderlich, “New Transparent RAM BIST Based on Self-Adjusting Output Data Compression,” in Design & Diagnostics of Electronic Circuits & Systems (DDECS’98), 1998, pp. 27–33."},"year":"1998","date_updated":"2022-05-11T16:52:31Z","extern":"1","page":"27-33"}