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<titleInfo><title>New Transparent RAM BIST Based on Self-Adjusting Output Data Compression</title></titleInfo>





<name type="personal">
  <namePart type="given">Vyacheslav</namePart>
  <namePart type="family">N. Yarmolik</namePart>
  <role><roleTerm type="text">author</roleTerm> </role></name>
<name type="personal">
  <namePart type="given">Yuri</namePart>
  <namePart type="family">V. Klimets</namePart>
  <role><roleTerm type="text">author</roleTerm> </role></name>
<name type="personal">
  <namePart type="given">Sybille</namePart>
  <namePart type="family">Hellebrand</namePart>
  <role><roleTerm type="text">author</roleTerm> </role><identifier type="local">209</identifier><description xsi:type="identifierDefinition" type="orcid">0000-0002-3717-3939</description></name>
<name type="personal">
  <namePart type="given">Hans-Joachim</namePart>
  <namePart type="family">Wunderlich</namePart>
  <role><roleTerm type="text">author</roleTerm> </role></name>







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  <identifier type="local">48</identifier>
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<originInfo><dateIssued encoding="w3cdtf">1998</dateIssued>
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<language><languageTerm authority="iso639-2b" type="code">eng</languageTerm>
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<relatedItem type="host"><titleInfo><title>Design &amp; Diagnostics of Electronic Circuits &amp; Systems (DDECS&apos;98)</title></titleInfo>
<part><extent unit="pages">27-33</extent>
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<bibliographicCitation>
<apa>N. Yarmolik, V., V. Klimets, Y., Hellebrand, S., &amp;#38; Wunderlich, H.-J. (1998). New Transparent RAM BIST Based on Self-Adjusting Output Data Compression. &lt;i&gt;Design &amp;#38; Diagnostics of Electronic Circuits &amp;#38; Systems (DDECS’98)&lt;/i&gt;, 27–33.</apa>
<ieee>V. N. Yarmolik, Y. V. Klimets, S. Hellebrand, and H.-J. Wunderlich, “New Transparent RAM BIST Based on Self-Adjusting Output Data Compression,” in &lt;i&gt;Design &amp;#38; Diagnostics of Electronic Circuits &amp;#38; Systems (DDECS’98)&lt;/i&gt;, 1998, pp. 27–33.</ieee>
<short>V. N. Yarmolik, Y. V. Klimets, S. Hellebrand, H.-J. Wunderlich, in: Design &amp;#38; Diagnostics of Electronic Circuits &amp;#38; Systems (DDECS’98), Szczyrk, Poland, 1998, pp. 27–33.</short>
<chicago>N. Yarmolik, Vyacheslav, Yuri V. Klimets, Sybille Hellebrand, and Hans-Joachim Wunderlich. “New Transparent RAM BIST Based on Self-Adjusting Output Data Compression.” In &lt;i&gt;Design &amp;#38; Diagnostics of Electronic Circuits &amp;#38; Systems (DDECS’98)&lt;/i&gt;, 27–33. Szczyrk, Poland, 1998.</chicago>
<mla>N. Yarmolik, Vyacheslav, et al. “New Transparent RAM BIST Based on Self-Adjusting Output Data Compression.” &lt;i&gt;Design &amp;#38; Diagnostics of Electronic Circuits &amp;#38; Systems (DDECS’98)&lt;/i&gt;, 1998, pp. 27–33.</mla>
<ama>N. Yarmolik V, V. Klimets Y, Hellebrand S, Wunderlich H-J. New Transparent RAM BIST Based on Self-Adjusting Output Data Compression. In: &lt;i&gt;Design &amp;#38; Diagnostics of Electronic Circuits &amp;#38; Systems (DDECS’98)&lt;/i&gt;. ; 1998:27-33.</ama>
<bibtex>@inproceedings{N. Yarmolik_V. Klimets_Hellebrand_Wunderlich_1998, place={Szczyrk, Poland}, title={New Transparent RAM BIST Based on Self-Adjusting Output Data Compression}, booktitle={Design &amp;#38; Diagnostics of Electronic Circuits &amp;#38; Systems (DDECS’98)}, author={N. Yarmolik, Vyacheslav and V. Klimets, Yuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998}, pages={27–33} }</bibtex>
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