{"year":"1998","status":"public","intvolume":"        15","publisher":"IEEE","author":[{"full_name":"Hellebrand, Sybille","id":"209","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","first_name":"Sybille"},{"full_name":"Hertwig, Andre","last_name":"Hertwig","first_name":"Andre"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"extern":"1","volume":15,"title":"Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications","_id":"13064","department":[{"_id":"48"}],"date_created":"2019-08-28T11:55:33Z","user_id":"209","citation":{"chicago":"Hellebrand, Sybille, Andre Hertwig, and Hans-Joachim Wunderlich. “Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications.” <i>IEEE Design and Test</i> 15, no. 4 (1998): 36–41.","short":"S. Hellebrand, A. Hertwig, H.-J. Wunderlich, IEEE Design and Test 15 (1998) 36–41.","bibtex":"@article{Hellebrand_Hertwig_Wunderlich_1998, title={Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications}, volume={15}, number={4}, journal={IEEE Design and Test}, publisher={IEEE}, author={Hellebrand, Sybille and Hertwig, Andre and Wunderlich, Hans-Joachim}, year={1998}, pages={36–41} }","apa":"Hellebrand, S., Hertwig, A., &#38; Wunderlich, H.-J. (1998). Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications. <i>IEEE Design and Test</i>, <i>15</i>(4), 36–41.","ama":"Hellebrand S, Hertwig A, Wunderlich H-J. Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications. <i>IEEE Design and Test</i>. 1998;15(4):36-41.","mla":"Hellebrand, Sybille, et al. “Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications.” <i>IEEE Design and Test</i>, vol. 15, no. 4, IEEE, 1998, pp. 36–41.","ieee":"S. Hellebrand, A. Hertwig, and H.-J. Wunderlich, “Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications,” <i>IEEE Design and Test</i>, vol. 15, no. 4, pp. 36–41, 1998."},"language":[{"iso":"eng"}],"issue":"4","type":"journal_article","date_updated":"2022-05-11T16:53:11Z","publication":"IEEE Design and Test","page":"36-41"}