{"publication":"IEEE Design and Test","page":"36-41","year":"1998","user_id":"209","department":[{"_id":"48"}],"status":"public","date_created":"2019-08-28T11:55:33Z","intvolume":"        15","_id":"13064","extern":"1","author":[{"full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand","id":"209"},{"full_name":"Hertwig, Andre","first_name":"Andre","last_name":"Hertwig"},{"last_name":"Wunderlich","first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim"}],"citation":{"apa":"Hellebrand, S., Hertwig, A., &#38; Wunderlich, H.-J. (1998). Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications. <i>IEEE Design and Test</i>, <i>15</i>(4), 36–41.","ama":"Hellebrand S, Hertwig A, Wunderlich H-J. Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications. <i>IEEE Design and Test</i>. 1998;15(4):36-41.","mla":"Hellebrand, Sybille, et al. “Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications.” <i>IEEE Design and Test</i>, vol. 15, no. 4, IEEE, 1998, pp. 36–41.","ieee":"S. Hellebrand, A. Hertwig, and H.-J. Wunderlich, “Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications,” <i>IEEE Design and Test</i>, vol. 15, no. 4, pp. 36–41, 1998.","chicago":"Hellebrand, Sybille, Andre Hertwig, and Hans-Joachim Wunderlich. “Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications.” <i>IEEE Design and Test</i> 15, no. 4 (1998): 36–41.","bibtex":"@article{Hellebrand_Hertwig_Wunderlich_1998, title={Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications}, volume={15}, number={4}, journal={IEEE Design and Test}, publisher={IEEE}, author={Hellebrand, Sybille and Hertwig, Andre and Wunderlich, Hans-Joachim}, year={1998}, pages={36–41} }","short":"S. Hellebrand, A. Hertwig, H.-J. Wunderlich, IEEE Design and Test 15 (1998) 36–41."},"title":"Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications","issue":"4","volume":15,"publisher":"IEEE","language":[{"iso":"eng"}],"date_updated":"2022-05-11T16:53:11Z","type":"journal_article"}