{"citation":{"short":"S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, Journal of Electronic Testing - Theory and Applications (JETTA) 18 (2002) 157–168.","ama":"Hellebrand S, Liang H-G, Wunderlich H-J. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. <i>Journal of Electronic Testing - Theory and Applications (JETTA)</i>. 2002;18(2):157-168.","chicago":"Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” <i>Journal of Electronic Testing - Theory and Applications (JETTA)</i> 18, no. 2 (2002): 157–68.","bibtex":"@article{Hellebrand_Liang_Wunderlich_2002, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, volume={18}, number={2}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2002}, pages={157–168} }","mla":"Hellebrand, Sybille, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” <i>Journal of Electronic Testing - Theory and Applications (JETTA)</i>, vol. 18, no. 2, 2002, pp. 157–68.","ieee":"S. Hellebrand, H.-G. Liang, and H.-J. Wunderlich, “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST,” <i>Journal of Electronic Testing - Theory and Applications (JETTA)</i>, vol. 18, no. 2, pp. 157–168, 2002.","apa":"Hellebrand, S., Liang, H.-G., &#38; Wunderlich, H.-J. (2002). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. <i>Journal of Electronic Testing - Theory and Applications (JETTA)</i>, <i>18</i>(2), 157–168."},"user_id":"209","department":[{"_id":"48"}],"volume":18,"_id":"13069","intvolume":"        18","language":[{"iso":"eng"}],"extern":"1","year":"2002","status":"public","author":[{"full_name":"Hellebrand, Sybille","last_name":"Hellebrand","id":"209","first_name":"Sybille","orcid":"0000-0002-3717-3939"},{"last_name":"Liang","full_name":"Liang, Hua-Guo","first_name":"Hua-Guo"},{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"}],"date_updated":"2022-05-11T16:43:32Z","publication":"Journal of Electronic Testing - Theory and Applications (JETTA)","issue":"2","date_created":"2019-08-28T11:57:39Z","title":"Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST","page":"157-168","type":"journal_article"}