[{"title":"Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs","date_updated":"2022-01-06T06:51:28Z","date_created":"2019-08-28T12:05:09Z","author":[{"first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939"},{"full_name":"Tarnick, Steffen","last_name":"Tarnick","first_name":"Steffen"},{"last_name":"Rajski","full_name":"Rajski, Janusz","first_name":"Janusz"},{"first_name":"Bernard","full_name":"Courtois, Bernard","last_name":"Courtois"}],"year":"1992","place":"IEEE Design for Testability Workshop, Vail, CO, USA","citation":{"short":"S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, IEEE Design for Testability Workshop, Vail, CO, USA, 1992.","bibtex":"@book{Hellebrand_Tarnick_Rajski_Courtois_1992, place={IEEE Design for Testability Workshop, Vail, CO, USA}, title={Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs}, author={Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}, year={1992} }","mla":"Hellebrand, Sybille, et al. <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. 1992.","apa":"Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1992). <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design for Testability Workshop, Vail, CO, USA.","ieee":"S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1992.","chicago":"Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois. <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1992.","ama":"Hellebrand S, Tarnick S, Rajski J, Courtois B. <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design for Testability Workshop, Vail, CO, USA; 1992."},"keyword":["WORKSHOP"],"extern":"1","language":[{"iso":"eng"}],"_id":"13076","department":[{"_id":"48"}],"user_id":"659","status":"public","type":"misc"}]