---
_id: '13076'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Steffen
  full_name: Tarnick, Steffen
  last_name: Tarnick
- first_name: Janusz
  full_name: Rajski, Janusz
  last_name: Rajski
- first_name: Bernard
  full_name: Courtois, Bernard
  last_name: Courtois
citation:
  ama: Hellebrand S, Tarnick S, Rajski J, Courtois B. <i>Generation of Vector Patterns
    through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design for Testability
    Workshop, Vail, CO, USA; 1992.
  apa: Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1992). <i>Generation
    of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design
    for Testability Workshop, Vail, CO, USA.
  bibtex: '@book{Hellebrand_Tarnick_Rajski_Courtois_1992, place={IEEE Design for Testability
    Workshop, Vail, CO, USA}, title={Generation of Vector Patterns through Reseeding
    of Multiple-Polynomial LFSRs}, author={Hellebrand, Sybille and Tarnick, Steffen
    and Rajski, Janusz and Courtois, Bernard}, year={1992} }'
  chicago: Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois.
    <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>.
    IEEE Design for Testability Workshop, Vail, CO, USA, 1992.
  ieee: S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, <i>Generation of Vector
    Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. IEEE Design for Testability
    Workshop, Vail, CO, USA, 1992.
  mla: Hellebrand, Sybille, et al. <i>Generation of Vector Patterns through Reseeding
    of Multiple-Polynomial LFSRs</i>. 1992.
  short: S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns
    through Reseeding of Multiple-Polynomial LFSRs, IEEE Design for Testability Workshop,
    Vail, CO, USA, 1992.
date_created: 2019-08-28T12:05:09Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: IEEE Design for Testability Workshop, Vail, CO, USA
status: public
title: Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs
type: misc
user_id: '659'
year: '1992'
...